5962F0151701VYA View Datasheet(PDF) - Aeroflex Corporation
Part Name
Description
Manufacturer
5962F0151701VYA Datasheet PDF : 11 Pages
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READ CYCLE
A combination of PE greater than VIH(min), and CE less than
VIL(max) defines a read cycle. Read access time is measured
from the latter of device enable, output enable, or valid address
to valid data output.
An address access read is initiated by a change in address inputs
while the chip is enabled withOE asserted and PE deasserted.
Valid data appears on data output, DQ(7:0), after the specified
tAVQV is satisfied. Outputs remain active throughout the entire
cycle. As long as device enable and output enable are active, the
address inputs may change at a rate equal to the minimum read
cycle time.
The chip enable-controlled access is initiated byCE going active
while OE remains asserted, PE remains deasserted, and the
addresses remain stable for the entire cycle. After the specified
tELQV is satisfied, the eight-bit word addressed by A(14:0)
appears at the data outputs DQ(7:0).
Output enable-controlled access is initiated by OE going active
while CE is asserted, PE is deasserted, and the addresses are
stable. Read access time is tGLQV unless tAVQV or tELQV have
not been satisfied.
AC CHARACTERISTICS READ CYCLE (Post-Radiation)*
(VDD = 3.0V to 3.6V; -55°C < TC < +125°C)
SYMBOL
PARAMETER
tAVAV 1
tAVQV
tAXQX 2
tGLQX2
tGLQV
tGHQZ
tELQX2
tELQV
tEHQZ
Read cycle time
Read access time
Output hold time
OE-controlled output enable time
OE-controlled access time
OE-controlled output three-state time
CE-controlled output enable time
CE-controlled access time
CE-controlled output three-state time
28F256LV-65
MIN
MAX
65
UNIT
ns
65
ns
0
ns
0
ns
35
ns
35
ns
0
ns
65
ns
35
ns
Notes:
* Post-radiation performance guaranteed at 25 °C per MIL-STD-883 Method 1019 at 1E6 rads(Si).
1. Functional test.
2. Three-state is defined as a 400mV change from steady-state output voltage.
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