5962D-0053603QUC View Datasheet(PDF) - Aeroflex UTMC

Part Name

Description

Manufacturer

5962D-0053603QUC

QCOTS™ UT9Q512 512K x 8 SRAM

Aeroflex UTMC 

VDD

E

DATA RETENTION MODE

50%

tEFR

VDR > 2.5V

50%

tR

Figure 7. Low VDD Data Retention Waveform

DATA RETENTION CHARACTERISTICS (Pre/Post-Irradiation)

(1 Second Data Retention Test)

SYMBOL

PARAMETER

VDR

VDD for data retention

IDDR 1,2

Data retention current

tEFR 1,3

Chip select to data retention time

tR1 ,3

Operation recovery time

Notes:

1. E = VDD - .2V, all other inputs = VDR or VSS.

2. Data retention current (ID D R) Tc = 25oC.

3. Not guaranteed or tested.

MINIMUM

2.5

--

0

tAVAV

MAXIMUM UNIT

--

V

5.0

mA

ns

ns

DATA RETENTION CHARACTERISTICS (Pre/Post-Irradiation)

(10 Second Data Retention Test, Tc= -55oC to 125oCf or (C) screening and -40oC to +125oC for (E) screening)

SYMBOL

PARAMETER

MINIMUM MAXIMUM UNIT

V DD 1

VDD for data retention

4.5

5.5

V

tEFR2, 3

Chip select to data retention time

0

ns

tR2, 3

Operation recovery time

tAVAV

ns

Notes:

1. Performed at VDD (min) and VDD (max).

2. E = VSS, all other inputs = VDR or VSS.

3. Not guaranteed or tested.

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