TrenchStop® Series
IKW25T120
td(off)
tf
100ns
td(on)
10ns
tr
1ns
0A
10A
20A
30A
40A
IC, COLLECTOR CURRENT
Figure 9. Typical switching times as a
function of collector current
(inductive load, TJ=150°C,
VCE=600V, VGE=0/15V, RG=22Ω,
Dynamic test circuit in Figure E)
td(off)
100 ns
tf
td(on)
tr
10 ns
1 ns
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ï—
ï—
ï—
ï—
RG, GATE RESISTOR
Figure 10. Typical switching times as a
function of gate resistor
(inductive load, TJ=150°C,
VCE=600V, VGE=0/15V, IC=25A,
Dynamic test circuit in Figure E)
td(off)
100ns
tf
td(on)
tr
10ns
0°C
50°C
100°C
150°C
TJ, JUNCTION TEMPERATURE
Figure 11. Typical switching times as a
function of junction temperature
(inductive load, VCE=600V,
VGE=0/15V, IC=25A, RG=22Ω,
Dynamic test circuit in Figure E)
7V
6V
5V
max.
typ.
4V
min.
3V
2V
1V
0V
-50°C
0°C
50°C 100°C 150°C
TJ, JUNCTION TEMPERATURE
Figure 12. Gate-emitter threshold voltage as
a function of junction temperature
(IC = 1.0mA)
IFAG IPC TD VLS
8
Rev. 2.3 12.06.2013