5962F9563003VXC View Datasheet(PDF) - Intersil
Part Name
Description
Manufacturer
5962F9563003VXC
Intersil
5962F9563003VXC Datasheet PDF : 7 Pages
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HS-1840ARH, HS-1840AEH, HS-1840BRH, HS-1840BEH
Burn-In/Life Test Circuits
+VS
GND
F4
1
2
R
3
4
5
6
7
8
9
10
11
12
13
14
R
28
27
-VS
26
R
25
24
23
22
21
20
19
18
F5
17
F1
16
F2
15
F3
+VS
GND
VR
1
2
R3
4
5
6
7
8
9
10
11
12
13
14
R
R
28
27
-VS
26
R
25
24
23
22
21
20
19
18
17
16
15
NOTE:
VS+ = +15.5V ±0.5V, VS- = -15.5V ±0.5V.
R = 1kΩ ±5%.
C1 = C2 = 0.01µF ±10%, 1 EACH PER SOCKET, MINIMUM.
D1 = D2 = 1N4002, 1 EACH PER BOARD, MINIMUM.
INPUT SIGNALS:
SQUARE WAVE, 50% DUTY CYCLE, 0V TO 15V PEAK ±10%.
F1 = 100kHz; F2 = F1/2; F3 = F1/4; F4 = F1/8; F5 = F1/16.
FIGURE 1. DYNAMIC BURN-IN AND LIFE TEST CIRCUIT
NOTES:
1. The above test circuits are utilized for all package types.
2. The Dynamic Test Circuit is utilized for all life testing.
NOTE:
R = 1kΩ ±5%, 1/4W.
C1 = C2 = 0.01µF MINIMUM, 1 EACH PER SOCKET, MINIMUM.
VS+ = 15.5V ±0.5V, VS- = -15.5V ±0.5V, VR = 15.5 ±0.5V
FIGURE 2. .STATIC BURN-IN TEST CIRCUIT
Irradiation Circuit
HS-1840ARH, HS-1840AEH, HS-1840BRH
+15V
1
NC
2
NC
3
+1V
4
5
6
7
8
9
10
11
12
13
14
28
27
-15V
1kΩ
26
25
24
23
22
21
20
19
18
17
16
15
+5V
NOTE:
3. All irradiation testing is performed in the 28 lead CERDIP package.
4
FN4355.5
April 6, 2012
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