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HEF4067B(2011) View Datasheet(PDF) - NXP Semiconductors.

Part Name
Description
Manufacturer
HEF4067B
(Rev.:2011)
NXP
NXP Semiconductors. NXP
HEF4067B Datasheet PDF : 19 Pages
First Prev 11 12 13 14 15 16 17 18 19
NXP Semiconductors
HEF4067B
16-channel analog multiplexer/demultiplexer
PULSE
VI
GENERATOR
VDD
VO
DUT
RT
VDD
RL S1
CL
open
001aag183
Test data is given in Table 10.
Definitions test circuit:
RT = termination resistance should be equal to output impedance Zo of the pulse generator
CL = load capacitance including jig and probe capacitance
RL = load resistor
S1 = test selection switch
Fig 12. Test circuit for measuring switching times
Table 10. Test data
Input
Yn, Z
An and E tr, tf
VDD or VSS VDD or VSS 20 ns
VM
0.5VDD
Load
CL
50 pF
RL
10 k
S1 position
tPHL[1]
tPLH
VDD or VSS VSS
tPZH, tPHZ tPZL, tPLZ other
VSS
VDD
VSS
[1] For Yn to Z or Z to Yn propagation delays use VSS. For An or to Yn or Z propagation delays use VDD.
HEF4067B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 6 — 16 November 2011
© NXP B.V. 2011. All rights reserved.
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