HAL2830 View Datasheet(PDF) - Micronas

Part Name

Description

Manufacturer

HAL2830

Linear Hall-Effect Sensor Family with SENT Interface

Micronas 

HAL 283x

DATA SHEET

Linear Hall-Effect Sensor Family with SENT Inter-

face

Release Note: Revision bars indicate significant

changes to the Advance Information.

1. Introduction

HAL 283x is a Micronas family of programmable linear

Hall-effect sensors with SENT output. The family con-

sists of the four members described in Table 1–1:

Table 1–1: Family Overview

Type

Resolution Pause SENT version

Period

HAL2830 12 bit

No

SAE-J2716 release

2010-01

HAL2831 16 bit

No

SAE-J2716 release

2010-01

HAL 2832 12 bit

Yes

SAE-J2716 release

2010-01

HAL2833 16 bit

Yes

SAE-J2716 release

2010-01

HAL 283x features a temperature-compensated Hall

plate with spinning-current offset compensation, an

A/D converter, digital signal processing, an EEPROM

memory with redundancy and lock function for the cali-

bration data, and protection devices at all pins. The

internal digital signal processing is of great benefit

because analog offsets, temperature shifts, and

mechanical stress do not degrade digital signals.

The easy programmability allows a 2-point calibration

by adjusting the output signal directly to the input sig-

nal (like mechanical angle, distance, or current). Indi-

vidual adjustment of each sensor during the cus-

tomer’s manufacturing process is possible. With this

calibration procedure, the tolerances of the sensor, the

magnet, and the mechanical positioning can be com-

pensated in the final assembly.

In addition, the temperature-compensation of the Hall

IC can be fit to all common magnetic materials by pro-

gramming first- and second-order temperature coeffi-

cients of the Hall sensor sensitivity. It is also possible

to compensate offset drifts over temperature gener-

ated by the customer application with a first-order tem-

perature coefficient of the sensor offset. This enables

operation over the full temperature range with high

accuracy.

For programming purposes, the sensor features a pro-

gramming interface with a Biphase-M protocol on the

DIO pin (output).

In the application mode, the sensor provides a continu-

ous SENT data stream.

1.1. Features

– High-precision linear Hall-effect sensor

– Spinning current offset compensation

– 20 bit digital signal processing

– Output resolution up to 16 bit

– Magnetic measurement range over temperature

adjustable from ±24 mT up to ±96 mT

– Sample period programmable from 0.5 ms to 33 ms

– Various sensor parameter are programmable: off-

set, sensitivity, temperature compensation for sensi-

tivity (2nd order) and offset (1st order), etc.

– Programming and operation of multiple sensors at

the same supply line

– Biphase-M interface (programming mode)

– Non-volatile memory with lock function

– SENT clock tick time programmable between 2 µs

and 17.75 µs

– Pulse low time programmable between 3 and

6.75 clock ticks

– Sample accurate transmission of magnetic field

information

– Transmission of temperature and device information

by serial data messages in the status nibble

– Open-drain output with slew rate control (load inde-

pendent)

– On-board diagnostics (overvoltage, output current,

overtemperature, signal path overflow)

– Power-on self-test covering all memories and full

signal path from Hall plates to SENT output

– ESD protection at DIO pin

– Reverse voltage and ESD protection at VSUP pin

– High immunity against mechanical stress, ESD, and

EMC

– AECQ-100 rev. G qualified

1.2. Major Applications

– Steering torque

– Suspension level

– Throttle position

– Pedal position

– Valve position

4

Jan. 18, 2016; DSH000165_002EN

Micronas

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