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FIN3386 View Datasheet(PDF) - Fairchild Semiconductor

Part Name
Description
Manufacturer
FIN3386 Datasheet PDF : 21 Pages
First Prev 11 12 13 14 15 16 17 18 19 20
Test Circuits
Figure 5. Differential LVDS Output DC Test Circuit
Notes:
A: For all input pulses, tR or tF<=1ns.
B: CL includes all probe and jig capacitance.
Figure 6. Differential Receiver Voltage Definitions, Propagation Delay, and Transition Time Test Circuit
Table 4. Receiver Minimum and Maximum Input Threshold Test Voltages
Applied Voltages (V)
VIA
VIB
1.25
1.15
1.15
1.25
2.40
2.30
2.30
2.40
0.10
0
0
0.10
1.50
0.90
0.90
1.50
2.40
1.80
1.80
2.40
0.60
0
0
0.60
Resulting Differential
Input Voltage (mV)
VID
100
-100
100
-100
100
-100
600
-600
600
-600
600
-600
Resulting Common
Mode Input Voltage (V)
VICM
1.20
1.20
2.35
2.35
0.05
0.05
1.20
1.20
2.10
2.10
0.30
0.30
© 2003 Fairchild Semiconductor Corporation
FIN3385 / FIN3386 • Rev. 1.0.6
13
www.fairchildsemi.com
 

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