Burn-In/Life Test Circuits
HS-0508RH, HS-0509RH
F0
1
F3
2
V1
3
4
D1
C1
5
6
7
R1
8
16
F1
15
F2
14
13
V2
12
D2 C2
11
10
9
1
2
V2
3
4
D1
C1
5
6
7
R1
8
V1
16
15
14
13
V3
12
D2 C2
11
10
9
HS-0508RH
DYNAMIC BURN-IN AND LIFE TEST CIRCUIT
V1 = -15V maximum, -16V minimum
V2 = +15V minimum, +16V maximum
R1 = 10kΩ ±5% 1/4W
C1 = C2 = 0.01µF minimum (per socket) or 0.1µF minimum (per row)
D1 = D2 = 1N4002 (or equivalent)
F0 = 100kHz 50% duty cycle; VIL = 0.8V max; VIH = 4.0V min.
F1 = F0/2
F2 = F1/2
F3 = F2/2
HS-0508RH
STATIC BURN-IN TEST CIRCUIT
V1 = 5V minimum, 6V maximum
V2 = -15V maximum, -16V minimum
V3 = +15V minimum, +16V maximum
R1 = 10kΩ ±5% 1/4W
C1 = C2 = 0.01µF minimum (per socket) or 0.1µF minimum (per row)
D1 = D2 = 1N4002 (or equivalent)
F0
1
F2
2
V3
3
4
D1
C1
5
6
7
8
R1
16
F1
15
14
V2
13
D1
C1
12
11
10
9
R1
1
2
V3
3
4
D1
C1
5
6
7
8
R1
16
V1
15
14
V2
13
D1
C1
12
11
10
9
R1
HS-0509RH
DYNAMIC BURN-IN AND LIFE TEST CIRCUIT
V2 = +15.5V, ±.0.5V
V3 = -15.5V, ±0.5V
R1 = 10kΩ, ±5%
C1 = 0.1µF minimum (per socket)
D1 = 1N4002 or equivalent (per board)
F0 = 100kHz, ±10%; F1 = F0/2; F2 = F1/2, 50% duty cycle,
VIL = 0.8V max.; VIH = 4.0V min.
HS-0509RH
STATIC BURN-IN TEST CIRCUIT
V1 = +5.5V, ±0.5V
V2 = +15.5V, ±0.5V
V3 = -15.5V, ±0.5V
R1 = 10kΩ, ±10%
C1 = 0.1µF minimum (per socket)
D1 = 1N4002 or equivalent (per board)
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