5962H3829437BXC View Datasheet(PDF) - Aeroflex UTMC

Part Name

Description

Manufacturer

5962H3829437BXC

Radiation-Hardened 8K x 8 SRAM -- SEU Hard

Aeroflex UTMC 

DATA RETENTION CHARACTERISTICS (Post-Radiation)

(TC = 25°C)

SYMBOL

PARAMETER

MINIMUM

VDR

IDDDR 1

tEFR 1

tR1

VDD for data retention

Data retention current

Chip deselect to data retention time

Operation recovery time

2.5

--

0

tAVAV

Notes:

* Post-radiation performance guaranteed at 25oC per MIL-STD-883 Method 1019 at 1.0E6 rads(Si).

1. VLC = 0.2V, V HC = V DD-0.2V, E 1> VHC, E2 > VHC

DATA RETENTION MODE

MAXIMUM UNIT

VDD @

2.0V 3.0V

--

V

75

90

µA

ns

ns

VDR > 2.5V

VDD

4.5V

4.5V

tEFR

E1

VIH

VDR

tR

VIH

Figure 5. Low VDD Data Retention Waveform

30pF

5.0V

446 ohms

174 ohms

90%

10%

< 5ns

Input Pulses

Notes:

1. 30pF including scope probe and test socket.

2. Measurement of data output occurs at the low to high or high to low transition mid-point

Figure 6. AC Test Loads and Input Waveforms

90%

10%

< 5ns

11

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