59629855202VYA View Datasheet(PDF) - Aeroflex UTMC

Part Name

Description

Manufacturer

59629855202VYA

RadHard MicroController

Aeroflex UTMC 

13.0 ELECTRICAL CHARACTERISTICS

VDD = 5.0V±10%; -55°C < TC < +125°C

SYMBOL

PARAMETER

CONDITION

VIL

Low-level input voltage6

TTL inputs

OSC inputs

VIH

High-level input voltage6

TTL inputs7

OSC inputs

IIN

Input leakage current

Inputs without resistors

VIN = VDD or VSS

Inputs with pull-down resistors VIN = VDD

Inputs with pull-up resistors

VIN = VSS

VOL Low-level output voltage

TTL outputs

OSC outputs

IOL = 3.2mA

IOL = 6.4mA Note 5

IOL = 0.1mA

VOH High-level output voltage

TTL outputs

OSC outputs

IOH = -0.4mA

IOH = -0.8mA Note 5

IOH = - 0.1mA

IOZ

Three-state output leakage current VO = VDD or VSS

IOS

Short-circuit output current 1,2 VDD = 5.5V, VO = 0V to VDD

MINIMUM MAXIMUM UNIT

.8

V

1.2

V

2.0

V

3.6

V

-10

10

µA

80

900

µA

-900

-80

µA

0.4

V

0.4

V

1.0

V

2.4

V

2.4

V

3.5

V

-10

-20 Note 5

+10

µA

+20 Note 5

µA

-100

+100

mA

-200 Note 5 +200 Note 5 mA

CIN

Input capacitance

F = 1MHz @ 0V

10

pF

COUT Output capacitance

F = 1MHz @ 0V

15

pF

CIO

Bidirectional I/O capacitance

F = 1MHz @ 0V

20

pF

IDD

Average operating current1, 4

F = 16MHz, CL = 50pF

F = 12MHz, CL = 50pF

75

mA

50

mA

QIDD Quiescent current

Note 3

1

mA

Notes:

1. Supplied as a design limit but not guaranteed or tested.

2. Not more than one output may be shorted at a time for maximum duration of one second.

3. All inputs with internal pull-ups or pull-downs should be left open circuit, all other inputs tied low or high. TEST input pin asserted.

4. Includes current through input pull-ups. Instantaneous surge currents on the order of 1 ampere can occur during output switching. Voltage supply should be

adequately sized and decoupled to handle a large current surge.

5. Double buffer output pins (i.e., DS, R/WR, M/IO).

6. Functional tests are conducted in accordance with MIL-STD-883 with the following input test conditions: VIH=VIH(min)+20%,-0%; VIL=VIL(max)+0%,-50%,

as specified herein, for TTL or CMOS compatible inputs. Devices may be tested using any input voltage within the above specified range, but are guaranteed to

VIH(min) and VIL(max).

7. Radiation-hardened technology shall have a VIH pre-irradiation of 2.2V.

47

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