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PKD01 View Datasheet(PDF) - Analog Devices

Part Name
Description
Manufacturer
PKD01 Datasheet PDF : 18 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
PKD01
WAFER TEST LIMITS (@ VS = ؎15 V, CH = 1000 pF, TA = 25؇C, unless otherwise noted.)
Parameter
Symbol Conditions
PKD01N
Limit
Unit
“gm” AMPLIFIERS A, B
Zero-Scale Error
Input Offset Voltage
Input Bias Current
Input Offset Current
Voltage Gain
Common-Mode Rejection Ratio
Power Supply Rejection Ratio
Input Voltage Range1
Feedthrough Error
COMPARATOR
Input Offset Voltage
Input Bias Current
Input Offset Current
Voltage Gain1
Common-Mode Rejection Ratio
Power Supply Rejection Ratio
Input Voltage Range1
Low Output Voltage
“OFF” Output Leakage Current
Output Short-Circuit Current
DIGITAL INPUTS–RST, DET2
Logic “1” Input Voltage
Logic “0” Input Voltage
Logic “1” Input Current
Logic “0” Input Current
MISCELLANEOUS
Droop Rate3
Output Voltage Swing Amplifier C
Short-Circuit Current Amplifier C
Power Supply Current
gm AMPLIFIERS A, B
Slew Rate
Acquisition Time1
COMPARATOR
Response Time
VZS
VOS
IB
IOS
AV
CMRR
PSRR
VCM
RL = 10 k, VO = ± 10 V
–10 V VCM +10 V
± 9 V VS ≤ ± 18 V
VIN = 20 V, DET = 1, RST = 0
VOS
IB
IOS
AV
CMRR
PSRR
VCM
VOL
IL
ISC
2 kPull-Up Resistor to 5 V
–10 V VCM +10 V
± 9 V VS ≤ ± 18 V
ISINK 5 mA, Logic GND = 5 V
VOUT = 5 V
VOUT = 5 V
VH
VL
IINH
VH = 3.5 V
IINL
VL = 0.4 V
VDR
TJ = 25°C,
TA = 25°C
VOP
RL = 2.5 k
ISC
ISY
No Load
SR
tA
0.1% Accuracy, 20 V Step, AVCL = 1
tA
0.01% Accuracy, 20 V Step, AVCL = 1
5 mV Overdrive, 2 kPull-Up Resistor to 5 V
7
6
250
75
10
74
76
± 11.5
66
3
1000
300
3.5
82
76
± 11.5
0.4
–0.2
80
45
7
2
0.8
1
10
0.1
0.20
± 11
40
7
9
0.5
41
45
150
mV max
mV max
nA max
nA max
V/mV min
dB min
dB min
V min
dB min
mV max
nA max
nA max
V/mV min
dB min
dB min
V min
V max
V min
µA max
mA min
mA min
V min
V max
µA max
µA max
mV/ms max
mV/ms max
V min
mA max
mA min
mA max
V/µs
µs
µs
ns
MISCELLANEOUS
Switch Aperture Time
Switching Time
Buffer Slew Rate
tAP
tS
SR
RL = 2.5 k
75
ns
50
ns
2.5
V/µs
NOTES
1Guaranteed by design.
2DET = 1, RST = 0.
3Due to limited production test times, the droop current corresponds to junction temperature (T J). The droop current vs. time (after power-on) curve clarifies this
point. Since most devices (in use) are on for more than 1 second, ADI specifies droop rate for ambient temperature (T A) also. The warmed-up (TA) droop current
specification is correlated to the junction temperature (TJ) value. ADI has a droop current cancellation circuit that minimizes droop current at high temperature.
Ambient (TA) temperature specifications are not subject to production testing.
REV. A
–5–
 

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