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74ACQ544SC View Datasheet(PDF) - Fairchild Semiconductor

Part Name
Description
Manufacturer
74ACQ544SC Datasheet PDF : 9 Pages
1 2 3 4 5 6 7 8 9
DC Electrical Characteristics for ACQ (Continued)
Symbol
Parameter
VCC
TA = + 25°C
TA = − 40°C to + 85°C Units
(V)
Typ
Guaranteed Limits
Conditions
VOLV
VIHD
Quiet Output
Minimum Dynamic VOL
Minimum HIGH Level
Dynamic Input Voltage
5.0
0.6
1.2
5.0
3.1
3.5
Figures 1, 2
V
(Note 5)(Note 6)
V (Note 5)(Note 7)
VILD
Maximum LOW Level
Dynamic Input Voltage
5.0
1.9
1.5
V (Note 5)(Note 7)
Note 2: All outputs loaded; thresholds on input associated with output under test.
Note 3: Maximum test duration 2.0 ms, one output loaded at a time.
Note 4: IIN and ICC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V VCC.
Note 5: DIP package.
Note 6: Max number of outputs defined as (n). Data Inputs are driven 0V to 5V. One output @ GND.
Note 7: Max number of Data Inputs (n) switching. (n-1) inputs switching 0V to 5V (ACQ). Input-under-test switching: 5V to threshold (VILD),
0V to threshold (VIHD). f = 1 MHz.
DC Electrical Characteristics for ACTQ
Symbol
Parameter
VIH
Minimum HIGH Level
Input Voltage
VIL
Maximum LOW Level
Input Voltage
VOH
Minimum HIGH Level
Output Voltage
VCC
TA = +25°C
TA = −40°C to +85°C
Units
(V)
Typ
Guaranteed Limits
4.5
1.5
2.0
2.0
V
5.5
1.5
2.0
2.0
4.5
1.5
0.8
0.8
V
5.5
1.5
0.8
0.8
4.5
4.49
4.4
4.4
V
5.5
5.49
5.4
5.4
VOL
Maximum LOW Level
Output Voltage
4.5
3.86
3.76
V
5.5
4.86
4.76
4.5
0.001
0.1
0.1
V
5.5
0.001
0.1
0.1
4.5
0.36
0.44
V
5.5
0.36
0.44
IIN
Maximum Input Leakage Current
5.5
IOZT
Maximum I/O
5.5
Leakage Current
± 0.1
± 1.0
µA
±0.6
±6.0
µA
ICCT
Maximum ICC/Input
5.5
0.6
1.5
mA
IOLD
Minimum Dynamic
5.5
75
mA
IOHD
Output Current (Note 9)
5.5
75
mA
ICC
Maximum Quiescent or GND
5.5
8.0
80.0
µA
VOLP
Quiet Output
5.0
1.1
1.5
V
Maximum Dynamic VOL
VOLV
Quiet Output
5.0
0.6
1.2
V
Minimum Dynamic VOL
VIHD
Maximum HIGH Level
5.0
1.9
2.2
V
Dynamic Input Voltage
VILD
Maximum LOW Level
5.0
1.2
0.8
V
Dynamic Input Voltage
Note 8: All outputs loaded; thresholds on input associated with output under test.
Note 9: Maximum test duration 2.0 ms, one output loaded at a time.
Note 10: DIP package.
Note 11: Max number of outputs defined as (n-1). Data Inputs are driven 0V to 3V, one output @ GND.
Note 12: Max number of Data Inputs (n) switching (n-1) inputs switching 0V to 3V (ACTQ). Input-under-test switching:
3V to threshold (VILD), 0V to threshold (VIHD), f = 1 MHz.
Conditions
VOUT = 0.1V
or VCC 0.1V
VOUT = 0.1V
or VCC 0.1V
IOUT = − 50 µA
VIN = VIL or VIH
IOH = − 24 mA
IOH = − 24 mA (Note 8)
IOUT = 50 µA
VIN = VIL or VIH
IOL = 24 mA
IOL = 24 mA (Note 8)
VI = VCC, GND
VI, (OE) = VIL, VIH
VO = VCC, GND
VI = VCC 2.1V
VOLD = 1.65V Max
VOHD = 3.85V Min
VIN = VCC
Figure 1, Figure 2
(Note 10)(Note 11)
Figure 1, Figure 2
(Note 10)(Note 11)
(Note 10)(Note 12)
(Note 10)(Note 12)
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