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FQP27P06 View Datasheet(PDF) - Fairchild Semiconductor

Part Name
Description
Manufacturer
FQP27P06 Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
Gate Charge Test Circuit & Waveform
Same Type
VGS
50KΩ
as DUT
12V
200nF
300nF
-10V
Qg
VGS
VDS
Qgs
Qgd
DUT
-3mA
Charge
Resistive Switching Test Circuit & Waveforms
-10V
VDS
VGS
RG
RL
VDD
DUT
VGS
10%
td(on)
t on
tr
VDS
90%
t off
td(off)
tf
-10V
tp
Unclamped Inductive Switching Test Circuit & Waveforms
L
VDS
EAS = --21-- L IAS2
------B--V--D--S-S-------
BVDSS - VDD
ID
tp
Time
RG
VDD
VDD
ID (t)
VDS (t)
DUT
IAS
BVDSS
©2001 Fairchild Semiconductor Corporation
5
FQP27P06 Rev.C0
www.fairchildsemi.com
 

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