ADRF6655
CHARACTERIZATION SETUPS
Figure 78 to Figure 80 show the general characterization bench
setups used extensively for the ADRF6655. The setup shown in
Figure 78 was used to do the bulk of the testing. An automated
Agilent VEE program was used to control the equipment over the
IEEE bus. This setup was used to measure gain, IP1dB, OP1dB,
IIP2, IIP3, OIP2, OIP3, LO-to-IF and LO-to-RF leakage, LO
amplitude, and supply current. The ADRF6655 was characterized
on an upconversion and downconversion evaluation board
configured for each conversion as described in the Input Matching
section and the Output Matching and Biasing section. For all
measurements of the ADRF6655, the loss of the RF input balun
was de-embedded.
To do phase noise and reference spurs measurements, see the
phase noise setup used in Figure 79. Phase noise measurements
were done on a downconversion board looking at the output at
different offsets.
Figure 80 shows the setup used to make the noise figure
measurements with no blocker present, and Figure 81 shows
the setup for making the noise figure measurements under
blocking conditions. Note that attention must be given to the
measurement setup. The RF blocker signal must be filtered
through a band-pass filter to prevent noise (which increases
when output power is increased) from contributing at the desired
RF frequency. At least 30 dB attenuation is needed at the desired
RF and image frequencies. For example, to generate a blocker
signal at the IF output of 205 MHz, the blocker signal generator
is set at 995 MHz, and the part is programmed to generate a LO
frequency of 1200 MHz that results in an output signal of 205 MHz.
This signal must be filtered out through a band reject filter on
the output so that the noise figure can be measured at 200 MHz,
which corresponds to the output frequency for LO = 1200 MHz
and RF input = 1000 MHz.
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