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FCPF20N60ST-G View Datasheet(PDF) - Fairchild Semiconductor

Part Name
Description
Manufacturer
FCPF20N60ST-G
Fairchild
Fairchild Semiconductor Fairchild
FCPF20N60ST-G Datasheet PDF : 14 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Qualification Plan Device
Package Process
Q20120267
FDB12N50TM TT263002 UNIFET1 300-500V_D2pak
No. of Lots
1
Reliability Test
PRECON
HTGB
HTRB
HTSL
HAST
PRCL
RSDH
TMCL
Condition
L1 245C
100 % Rated VGS, Tj
max=150C
80% of Rated BV, Tj
max=150C
150 C
130 C, 85% RH,
Vds=42V
Delta 100C, 2 min on,
3.5 min off
260C
-65 C to 150 C, 30 min/
cycles
Standard
JESD22-A113
Device Name
Lot No.
Duration
5 Cycles 24 hrs
JESD22-A108 1000hrs
JESD22-A108 1000hrs
JESD22-A103 1000hrs
JESD22-A110
MIL-STD-750-
1036
JESD22-B106
96hrs
8572 cycles
10 sec
JESD22-A104 500 cycles
FDB12N50TM
Q20120267AA
Result/FA
0/154
0/77
0/77
0/77
0/77
0/77
0/30
0/77
Qualification Plan
Q20120268
Device
FCA47N60
Package
TT3P0003
Process
SuperFET 600V TO3P/TO247
No. of Lots
1
Reliability Test
HTGB
HTRB
HTSL
HAST
PRCL
RSDH
TMCL
Condition
100 % Rated VGS, Tj max=150C
80% of Rated BV, Tj max=150C
150 C
130 C, 85% RH, Vds=42V
Delta 100C, 5 min on, 3.5 min off
260C
-65 C to 150 C, 30 min/ cycles
Standard
JESD22-A108
JESD22-A108
JESD22-A103
JESD22-A110
MIL-STD-750-1036
JESD22-B106
JESD22-A104
Device Name
Lot No.
Duration
1000hrs
1000hrs
1000hrs
96hrs
6000 cycles
10 sec
500 cycles
FCA47N60
Q20120268AA
Result/FA
0/77
0/77
0/77
0/77
0/77
0/30
0/77
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