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74LVT02DB,112 View Datasheet(PDF) - NXP Semiconductors.

Part Name
Description
Manufacturer
74LVT02DB,112
NXP
NXP Semiconductors. NXP
74LVT02DB,112 Datasheet PDF : 13 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Nexperia
74LVT02
3.3 V Quad 2-input NOR gate
VI 90 %
tW
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VM
tr
tf
VM
VI
PULSE
GENERATOR
VCC
VO
DUT
RT
CL
RL
001aaf615
Test data is given in Table 9.
Definitions test circuit:
RT = termination resistance should be equal to output impedance Zo of the pulse generator.
CL = load capacitance including jig and probe capacitance.
RL = load resistance.
Figure 7. Test circuit for measuring switching times
Table 9. Test data
Input
VI
2.7 V
fi
≤ 10 MHz
tW
500 ns
tr, tf
≤ 2.5 ns
Load
CL
50 pF
RL
500 Ω
Test
tPLH, tPHL
74LVT02
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 7 April 2017
© Nexperia B.V. 2017. All rights reserved.
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