HCF40174BEY View Datasheet(PDF) - STMicroelectronics

Part Name

Description

Manufacturer

HCF40174BEY

HEX D - TYPE FLIP-FLOP

STMicroelectronics 

HCF40174B

TEST CIRCUIT

CL = 50pF or equivalent (includes jig and probe capacitance)

RL = 200KΩ

RT = ZOUT of pulse generator (typically 50Ω)

WAVEFORM : PROPAGATION DELAY TIMES (f=1MHz; 50% duty cycle)

6/9

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