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M74HCT157M1R View Datasheet(PDF) - STMicroelectronics

Part Name
Description
Manufacturer
M74HCT157M1R
ST-Microelectronics
STMicroelectronics ST-Microelectronics
M74HCT157M1R Datasheet PDF : 9 Pages
1 2 3 4 5 6 7 8 9
M74HCT157
CAPACITIVE CHARACTERISTICS
Test Condition
Value
Symbol
Parameter
VCC
(V)
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
CIN Input Capacitance 5.0
5 10
10
10 pF
CPD Power Dissipation
Capacitance (note 5.0
50
pF
1)
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/4(per chan-
nel)
TEST CIRCUIT
CL = 50pF or equivalent (includes jig and probe capacitance)
RT = ZOUT of pulse generator (typically 50)
WAVEFORM : PROPAGATION DELAY TIMES (f=1MHz; 50% duty cycle)
5/9
 

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