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NE3210S01-T1B View Datasheet(PDF) - California Eastern Laboratories.

Part Name
Description
Manufacturer
NE3210S01-T1B
CEL
California Eastern Laboratories. CEL
NE3210S01-T1B Datasheet PDF : 7 Pages
1 2 3 4 5 6 7
NEC's SUPER LOW
NOISE HJ FET
NE3210S01
FEATURES
• SUPER LOW NOISE FIGURE:
0.35 dB TYP at f = 12 GHz
• HIGH ASSOCIATED GAIN:
13.5 dB TYP at f = 12 GHz
• GATE LENGTH: LG ≤ 0.20 μm
• GATE WIDTH: WG = 160 μm
DESCRIPTION
NEC's NE3210S01 is a pseudomorphic Hetero-Junction FET
that uses the junction between Si-doped AIGaAs and undoped
InGaAs to create very high mobility electrons. The device
features mushroom shaped TiAl gates for decreased gate
resistance and improved power handling. Its excellent low
noise figure and high associated gain make it suitable for DBS
and commercial systems. The NE 3210S01 is housed in a low
cost plastic package which is available in tape and reel.
NEC's stringent quality assurance and test procedures assure
the highest reliability and performance.
OUTLINE DIMENSION (Units in mm)
PACKAGE OUTLINE SO1
2.0 ± 0.2
1
2.0 ± 0.2
2
K
0.5
TYP
4
2.0±0.2
0.125 ± 0.05
3
0.65 TYP
1.9 ± 0.2
1.6
1. Source
2. Drain
3. Source
4. Gate
0.4 MAX
4.0 ± 0.2
1.5 MAX
ELECTRICAL CHARACTERISTICS (TA = 25°C)
PART NUMBER
PACKAGE OUTLINE
NE3210S01
S01
SYMBOLS
PARAMETERS AND CONDITIONS
UNITS
MIN
TYP
MAX
GA
Associated Gain1, VDS = 2 V, ID = 10 mA, f = 12 GHz
dB
12
13.5
NF
Noise Figure1, VDS = 2 V, ID = 10 mA, f = 12 GHz
dB
0.35
0.45
gm
Transconductance, VDS = 2 V, ID = 10 mA
mS
40
55
IDSS
Saturated Drain Current, VDS = 2 V, VGS = 0 V
mA
15
40
70
VP
Gate to Source Cutoff Voltage, VDS = 2 V, ID = 100 μA
V
-0.2
-0.7
-2.0
IGSO
Gate to Source Leakage Current, VGS = -3 V
uA
0.5
10
Note:
1. Typical values of noise figures and associated gain are those obtained when 50% of the devices from a large number of lots were individually
measured in a circuit with the input individually tuned to obtain the minimum value. Maximum values are criteria established on the production
line as a "go-no-go" screening tuned for the "generic" type but not each specimen.
California Eastern Laboratories
 

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