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FDR840P View Datasheet(PDF) - Analog Devices

Part Name
Description
Manufacturer
FDR840P
ADI
Analog Devices ADI
FDR840P Datasheet PDF : 22 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
ADN8830
ABSOLUTE MAXIMUM RATINGS*
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 V
Input Voltage . . . . . . . . . . . . . . . . . . . . . . . GND to VS + 0.3 V
Storage Temperature Range . . . . . . . . . . . . . –65°C to +150°C
Operating Temperature Range . . . . . . . . . . . . –40°C to +85°C
Operating Junction Temperature . . . . . . . . . . . . . . . . . . 125°C
Lead Temperature Range (Soldering, 10 sec) . . . . . . . . 300°C
ESD RATINGS
883 (Human Body) Model . . . . . . . . . . . . . . . . . . . . . . 1.0 kV
*Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
Package Type
32-Lead LFCSP (ACP)
JA*
JC
35
10
Unit
°C/W
*JA is specified for worst-case conditions, i.e., JA is specified for a device
soldered in a 4-layer circuit board for surface-mount packages.
PIN CONFIGURATION
THERMFAULT 1
THERMIN 2
SD 3
TEMPSET 4
TEMPLOCK 5
NC 6
VREF 7
AVDD 8
PIN 1
INDICATOR
ADN8830
TOP VIEW
24 COMPOSC
23 PGND
22 N1
21 P1
20 PVDD
19 OUT A
18 COMPSWIN
17 COMPSWOUT
NC = NO CONNECT
CAUTION
THE EXPOSED PAD ON THE BOTTOM OF THE
PACKAGE MUST BE CONNECTED TO VCC OR
THE GND PLANE.
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
ADN8830 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended
to avoid performance degradation or loss of functionality.
REV. D
–3–
 

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