LB11685AV View Datasheet(PDF) - ON Semiconductor

Part Name

Description

Manufacturer

LB11685AV

3-phase sensor less Motor driver

ON Semiconductor 

Ordering number : ENA1772A

LB11685AV

Monolithic Digital IC

3-phase sensor less

Motor driver

http://onsemi.com

Overview

The LB11685AV is a three-phase full-wave current-linear-drive motor driver IC. It adopts a sensor less control system

without the use of a Hall Effect device. For quieter operation, the LB11685AV features a current soft switching circuit

and be optimal for driving the cooling fan motors used in refrigerators, etc.

Functions

• Three-phase full-wave linear drive (Hall sensor-less method)

• Built-in three-phase output voltage control circuit

• Motor lock protection detection output

• Built-in thermal shut down circuit

• Built-in current limiter circuit

• Built-in motor lock protection circuit

• FG output made by back EMF

• Beat lock prevention circuit

Specifications

Maximum Ratings at Ta = 25°C

Parameter

Symbol

Conditions

Ratings

Unit

Maximum supply voltage

Input applied voltage

Maximum output current

Allowable power dissipation

VCC max

VIN max

IO max *1

Pd max

Mounted on a board *2

19

V

-0.3 to VCC +0.3

V

1.2

A

1.05

W

Operating temperature

Topr

-40 to 85

°C

Storage temperature

Tstg

-55 to 150

°C

Junction temperature

Tj max

150

°C

*1: The IO is a peak value of motor-current.

*2: Specified board: 76.1mm × 114.3mm × 1.6mm, glass epoxy board.

Caution 1) Absolute maximum ratings represent the value which cannot be exceeded for any length of time.

Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high current,

high voltage, or drastic temperature change, the reliability of the IC may be degraded. Please contact us for the further details.

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating

Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.

Semiconductor Components Industries, LLC, 2013

May, 2013

71812 SY/61610 SY 20100604-S00001 No.A1772-1/7

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