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Part NameTND307 ON-Semiconductor
ON Semiconductor ON-Semiconductor
DescriptionGraphical Data Test Circuits for the NCP1650
TND307 Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
TND307
Graphical Data Test
Circuits for the NCP1650
Prepared by
Alan Ball
ON Semiconductor Applications Engineering
The following circuits are the test configurations that
were used to obtain the data for the graphical section of the
NCP1650/D data sheet. Each graph has a schematic
associated with it and in some cases a description of the
procedure.
http://onsemi.com
APPLICATION NOTE
30 k
0.5 mF
0–5 V
0.1 mF
47 k
1
3
Vin
AC Comp
4 Ref Filter
5 AC Input
6 FB/SD
7 Loop Comp
8 Pcomp
9 Pmax
2 0.1 mF
Vref
14 V
1 mF
Output 16
IS– 12
300
0 to –5 V
Iavg
10
11
Iavg fltr
1 nF
Ramp
GND
15
CT Comp
14 13
15 k
10
10 k 470 pF
47 k
Figure 1. Power Multiplier Family of Curves
Re: NCP1650/D data sheet, Figure 3
Power up chip. Set IS– between 0 and –200 mV in 50 mV
increments. For each value of IS– set the ac input (pin 5) to
various values from 0 to 3.8 volts. Record output Pmax (pin 9).
30 k
0.05 mF
0–5 V
0–5 V
1k
1
2 0.1 mF
3
Vin
AC Comp
4 Ref Filter
5 AC Input
6 FB/SD
7 Loop Comp
8 Pcomp
9 Pmax
Vref
Output 16
IS– 12
Iavg
10
11
Iavg fltr
Ramp
GND
CT Comp
15
14 13
10 k 470 pF
47 k
14 V
1 mF
Figure 2. Reference Multiplier Family of Curves
Re: NCP1650/D data sheet, Figure 4
© Semiconductor Components Industries, LLC, 2002
1
March, 2002 – Rev.0
Publication Order Number:
TND307/D
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