J309 View Datasheet(PDF) - Vishay Semiconductors
Part Name
Description
Manufacturer
J309 Datasheet PDF : 8 Pages
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J/SST/U308 Series
Vishay Siliconix
SPECIFICATIONS FOR U309 AND U310 (TA = 25_C UNLESS NOTED)
Limits
U309
U310
Parameter
Symbol
Test Conditions
Typa Min Max Min Max Unit
Static
Gate-Source Breakdown Voltage
Gate-Source Cutoff Voltage
Saturation Drain Currentb
Gate Reverse Current
Gate Operating Current
Drain-Source On-Resistance
Gate-Source Forward Voltage
Dynamic
V(BR)GSS
VGS(off)
IDSS
IGSS
IG
rDS(on)
VGS(F)
IG = −1 mA , VDS = 0 V
VDS = 10 V, ID = 1 nA
VDS = 10 V, VGS = 0 V
VGS = −15 V, VDS = 0 V
TA = 125_C
VDG = 9 V, ID = 10 mA
VGS = 0 V, ID = 1 mA
IG = 10 mA , VDS = 0 V
−35
−25
−25
V
−1
−4 −2.5 −6
V
12
30
24
60
mA
−0.002
−0.15
−0.15 nA
−0.001
−0.15
−0.15 mA
−15
pA
35
W
0.7
1
1
V
Common-Source
Forward Transconductance
Common-Source
Output Conductance
Common-Source
Input Capacitance
Common-Source
Reverse Transfer Capacitance
Equivalent Input Noise Voltage
High Frequency
gfs
14
10
10
mS
VDS = 10 V, ID = 10 mA
f = 1 kHz
gos
110
250
250
mS
Ciss
4
VDS = 10 V, VGS = −10 V
f = 1 MHz
Crss
1.9
en
VDS = 10 V, ID = 10 mA
f = 100 Hz
6
5
5
pF
2.5
2.5
nV⁄
√Hz
Common-Gate
Forward Transconductance
Common-Gate
Output Conductance
Common-Gate Power Gainc, d
Noise Figured
f = 105 MHz
14
gfg
f = 450 MHz
13
mS
f = 105 MHz
0.16
gog
f = 450 MHz
0.55
VDS = 10 V
ID = 10 mA
f = 105 MHz
16
14
14
Gpg
f = 450 MHz
11.5
10
10
dB
f = 105 MHz
1.5
2
2
NF
f = 450 MHz
2.7
3.5
3.5
Notes
a. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
b. Pulse test: PW v300 ms duty cycle v3%.
c. Gain (Gpg) measured at optimum input noise match.
d. Not a production test.
NZB
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
Document Number: 70237
S-50149—Rev. H, 24-Jan-05
www.vishay.com
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