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CBT3253C View Datasheet(PDF) - Texas Instruments

Part NameCBT3253C TI
Texas Instruments TI
DescriptionDUAL 1-OF-4 FET MULTIPLEXER/DEMULTIPLEXER 5-V BUS SWITCH WITH –2-V UNDERSHOOT PROTECTION
CBT3253C Datasheet PDF : 24 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
www.ti.com
SN74CBT3253C
DUAL 1-OF-4 FET MULTIPLEXER/DEMULTIPLEXER
5-V BUS SWITCH WITH –2-V UNDERSHOOT PROTECTION
SCDS123B – JULY 2003 – REVISED JANUARY 2007
PARAMETER MEASUREMENT INFORMATION
Input Generator
50
VG1
Input Generator
50
VG2
VIN
50
VI
50
VCC
DUT
TEST CIRCUIT
VO
CL
(see Note A)
RL
RL
7V
S1
Open
GND
TEST
tpd(s)
tPLZ/tPZL
tPHZ/tPZH
VCC
5 V ± 0.5 V
4V
5 V ± 0.5 V
4V
5 V ± 0.5 V
4V
S1
Open
Open
7V
7V
Open
Open
RL
500
500
500
500
500
500
VI
VCC or GND
VCC or GND
GND
GND
VCC
VCC
CL
50 pF
50 pF
50 pF
50 pF
50 pF
50 pF
V
0.3 V
0.3 V
0.3 V
0.3 V
Output
Control
(VIN)
1.5 V
3V
1.5 V
0V
Output
Control
(VIN)
1.5 V
3V
1.5 V
0V
tPLH
tPHL
Output
1.5 V
VOH
1.5 V
VOL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES (tpd(s))
Output
Waveform 1
S1 at 7 V
(see Note B)
Output
Waveform 2
S1 at Open
(see Note B)
tPZL
tPLZ
tPZH
1.5 V
3.5 V
VOL + V
tPHZ
VOL
1.5 V
VOH
VOH − V
0V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR 10 MHz, ZO = 50 , tr 2.5 ns, tf 2.5 ns.
D. The outputs are measured one at a time, with one transition per measurement.
E. tPLZ and tPHZ are the same as tdis.
F. tPZL and tPZH are the same as ten.
G. tPLH and tPHL are the same as tpd(s). The tpd propagation delay is the calculated RC time constant of the typical ON-state resistance
of the switch and the specified load capacitance, when driven by an ideal voltage source (zero output impedance).
H. All parameters and waveforms are not applicable to all devices.
Figure 3. Test Circuit and Voltage Waveforms
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