Figure 1. SWITCHING TEST CIRCUITS
DEVICE UNDER
TEST
CL
6.2K ohm
MX29LV040
2.7K ohm
+3.3V
DIODES=IN3064
OR EQUIVALENT
CL=100pF Including jig capacitance
CL=30pF for MX29LV040-70 & MX29LV040-55R
Figure 2. SWITCHING TEST WAVEFORMS
3.0V
0V
1.5V
INPUT
TEST POINTS
1.5V
OUTPUT
AC TESTING: Inputs are driven at 3.0V for a logic "1" and 0V for a logic "0".
Input pulse rise and fall times are < 5ns.
P/N:PM0722
REV. 0.7, JUL. 12, 2001
20