M95040, M95020, M95010
Table 18. AC Characteristics (M950x0, Device Grade 6)
Test conditions specified in Table 11. and Table 8.
Symbol Alt.
Parameter
Min.3 Max.3
fC
fSCK Clock Frequency
D.C.
5
tSLCH
tCSS1 S Active Setup Time
90
tSHCH
tCSS2 S Not Active Setup Time
90
tSHSL
tCS S Deselect Time
100
tCHSH
tCSH S Active Hold Time
90
tCHSL
S Not Active Hold Time
90
tCH 1
tCLH Clock High Time
90
tCL 1
tCLL Clock Low Time
90
tCLCH 2
tRC Clock Rise Time
1
tCHCL 2
tFC Clock Fall Time
1
tDVCH
tDSU Data In Setup Time
20
tCHDX
tDH Data In Hold Time
30
tHHCH
Clock Low Hold Time after HOLD not Active
70
tHLCH
Clock Low Hold Time after HOLD Active
40
tCHHL
Clock High Set-up Time before HOLD Active
tCH
tCHHH
Clock High Set-up Time before HOLD not Active tCH
tSHQZ 2
tDIS Output Disable Time
100
tCLQV
tV
Clock Low to Output Valid
60
tCLQX
tHO Output Hold Time
0
tQLQH 2
tRO Output Rise Time
50
tQHQL 2
tFO Output Fall Time
50
tHHQV
tLZ HOLD High to Output Valid
50
tHLQZ 2
tHZ HOLD Low to Output High-Z
100
tW
tWC Write Time
10
Note: 1. tCH + tCL must never be less than the shortest possible clock period, 1 / fC(max)
2. Value guaranteed by characterization, not 100% tested in production.
3. Previous product: identified by Process Identification letter K.
4. Present product: identified by Process Identification letter W or G.
Min.4 Max.4
D.C. 10
15
15
40
25
15
40
40
1
1
15
15
15
20
30
30
25
35
0
20
20
25
35
5
Unit
MHz
ns
ns
ns
ns
ns
ns
ns
µs
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
25/37