DatasheetQ Logo
Electronic component search and free download site.
Transistors,MosFET ,Diode,Integrated circuits

M27V160-120B1TR View Datasheet(PDF) - STMicroelectronics

Part Name
Description
Manufacturer
M27V160-120B1TR Datasheet PDF : 15 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
M27V160
Table 8. Read Mode AC Characteristics (1)
(TA = 0 to 70°C or –40 to 85°C; VCC = 3.3V ± 10%; VPP = VCC)
M27V160
Symbol Alt
Parameter
Test Condition -100 (3)
-120
-150 Unit
Min Max Min Max Min Max
tAVQV tACC Address Valid to Output Valid
E = VIL, G = VIL
100
120
150 ns
tBHQV tST BYTE High to Output Valid
E = VIL, G = VIL
100
120
150 ns
tELQV tCE Chip Enable Low to Output Valid
G = VIL
100
120
150 ns
tGLQV
tOE
Output Enable Low to Output
Valid
E = VIL
50
60
60 ns
tBLQZ (2) tSTD BYTE Low to Output Hi-Z
E = VIL, G = VIL
45
50
50 ns
tEHQZ (2) tDF Chip Enable High to Output Hi-Z
G = VIL
0 45 0 50 0 50 ns
tGHQZ (2)
tDF
Output Enable High to Output
Hi-Z
E = VIL
0 45 0 50 0 50 ns
tAXQX
tOH
Address Transition to Output
Transition
E = VIL, G = VIL 5
5
5
ns
tBLQX tOH BYTE Low to Output Transition
E = VIL, G = VIL 5
5
5
ns
Note: 1. VCC must be applied simultaneously with or before VPP and removed simultaneously or after VPP
2. Sampled only, not 100% tested.
3. Speed obtained with High Speed measurement conditions.
Figure 5. Word-Wide Read Mode AC Waveforms
A0-A19
E
G
Q0-Q15
Note: BYTEVPP = VIH.
VALID
tAVQV
tGLQV
tELQV
tAXQX
VALID
tEHQZ
tGHQZ
Hi-Z
AI00741B
6/15
 

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]