LIS331HHTR View Datasheet(PDF) - STMicroelectronics
Part Name
Description
Manufacturer
LIS331HHTR
STMicroelectronics
LIS331HHTR Datasheet PDF : 37 Pages
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LIS331HH
Mechanical and electrical specifications
2
Mechanical and electrical specifications
2.1
Mechanical characteristics
Table 3.
Symbol
Mechanical characteristics @ Vdd = 2.5 V, T = 25 °C unless otherwise noted (1)
Parameter
Test conditions
Min. Typ.(2) Max.
Unit
FS
So
TCSo
TyOff
TCOff
An
Vst
Measurement range(3)
Sensitivity
Sensitivity change vs
temperature
Typical zero-g level offset
accuracy(4),(5)
Zero-g level change vs
temperature
Acceleration noise density
Self-test
output change(6),(7),(8)
FS bit set to 00
FS bit set to 01
FS bit set to 11
FS bit set to 00
12 bit representation
FS bit set to 01
12 bit representation
FS bit set to 11
12 bit representation
FS bit set to 00
FS bit set to 00
Max delta from 25 °C
FS bit set to 00
FS bit set to 00
X axis
FS bit set to 00
Y axis
FS bit set to 00
Z axis
±6
±12
g
±24
3
6
mg/digit
12
±0.01
%/°C
±70
mg
±0.4
mg/°C
650
µg/ Hz
50
110
180
LSb
-50
-100
-180
LSb
220
290
370
LSb
Top Operating temperature range
Wh Product weight
-40
+85
°C
20
mgram
1. The product is factory calibrated at 2.5 V. The operational power supply range is from 2.16 V to 3.6 V.
2. Typical specifications are not guaranteed
3. Verified by wafer level test and measurement of initial offset and sensitivity
4. Typical zero-g level offset value after MSL3 preconditioning
5. Offset can be eliminated by enabling the built-in high pass filter
6. The sign of “Self-test output change” is defined by CTRL_REG4 STsign bit (Table 27), for all axes.
7. Self-test output changes with the power supply. “Self-test output change” is defined as
OUTPUT[LSb](CTRL_REG4 ST bit=1) - OUTPUT[LSb](CTRL_REG4 ST bit=0). 1LSb=12g/4096 at 12bit representation, ±6 g Full-
scale
8. Output data reach 99% of final value after 1/ODR+1ms when enabling self-test mode, due to device filtering
Doc ID 16366 Rev 1
9/37
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