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ISL12020MIRZ View Datasheet(PDF) - Intersil

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ISL12020MIRZ Datasheet PDF : 32 Pages
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ISL12020M
I2C Interface Specifications
Test Conditions: VDD = +2.7 to +5.5V, Temperature = -40°C to +85°C, unless otherwise
specified. Boldface limits apply over the operating temperature range,
-40°C to +85°C. (Continued)
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
(Note 8) (Note 9) (Note 8) UNITS NOTES
tHD:STA
tSU:DAT
tHD:DAT
tSU:STO
tHD:STO
tDH
START Condition Hold Time
Input Data Setup Time
Input Data Hold Time
STOP Condition Setup Time
STOP Condition Hold Time
Output Data Hold Time
From SDA falling edge
crossing 30% of VDD to
SCL falling edge
crossing 70% of VDD.
From SDA exiting the
30% to 70% of VDD
window, to SCL rising
edge crossing 30% of
VDD.
From SCL falling edge
crossing 30% of VDD to
SDA entering the 30%
to 70% of VDD window.
From SCL rising edge
crossing 70% of VDD, to
SDA rising edge
crossing 30% of VDD.
From SDA rising edge to
SCL falling edge. Both
crossing 70% of VDD.
From SCL falling edge
crossing 30% of VDD,
until SDA enters the
30% to 70% of VDD
window.
600
100
20
600
600
0
ns
ns
900
ns
ns
ns
ns
tR
SDA and SCL Rise Time
From 30% to 70% of 20 + 0.1 x
VDD.
Cb
tF
SDA and SCL Fall Time
From 70% to 30% of 20 + 0.1 x
VDD.
Cb
Cb
Capacitive Loading of SDA or Total on-chip and
10
SCL
off-chip
300
ns
16
300
ns
16
400
pF
16
RPU
SDA and SCL Bus Pull-up
Maximum is determined
1
Resistor Off-chip
by tR and tF.
For Cb = 400pF, max is
about 2kΩ~2.5kΩ.
For Cb = 40pF, max is
about 15kΩ~20kΩ
kΩ
16
NOTES:
8. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits
established by characterization and are not production tested.
9. Specified at +25°C.
10. Minimum VDD and/or VBAT of 1V to sustain the SRAM. The value is based on characterization and it is not tested.
11. Temperature Conversion is inactive below VBAT = 2.7V. Device operation is not guaranteed at VBAT<1.8V.
12. IRQ/FOUT Inactive.
13. VDD > VBAT +VBATHYS
14. In order to ensure proper timekeeping, the VDD SR- specification must be followed.
15. Limits should be considered typical and are not production tested.
16. These are I2C specific parameters and are not tested, however, they are used to set conditions for testing devices
to validate specification.
7
FN6667.4
February 11, 2010
 

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