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HCF4009UB View Datasheet(PDF) - STMicroelectronics

Part Name
Description
Manufacturer
HCF4009UB
ST-Microelectronics
STMicroelectronics ST-Microelectronics
HCF4009UB Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
HCF4009UB
DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb = 25°C, CL = 50pF, RL = 200K, tr = tf = 20 ns)
Symbol
Parameter
tTLH Output Transition
Time
tTHL Output Transition
Time
tPLH Propagation Delay
Time
tPHL Propagation Delay
Time
VDD (V)
5
10
15
5
10
15
5
10
10
15
15
5
10
10
15
15
VI (V)
5
10
15
5
10
15
5
10
10
15
15
5
10
10
15
15
Test Condition
VCC (V)
5
10
15
5
10
15
5
10
5
15
5
5
10
5
15
5
Value (*)
Unit
Min. Typ. Max.
150 350
75 15 ns
55 110
35 70
20 40 ns
15 30
70 140
40 80
35 70 ns
30 60
30 600
30 60
20 40
15 30 ns
15 30
10 20
(*) Typical temperature coefficent for all VDD value is 0.3 %/°C.
TEST CIRCUIT
CL = 50pF or equivalent (includes jig and probe capacitance)
RL = 200K
RT = ZOUT of pulse generator (typically 50)
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