CY7C1354A
CY7C1356A
Selection
Circuitry
TDI
0
Bypass Register
210
Instruction Register
Selection
Circuitry
TDO
31 30 29 . . 2 1 0
Identification Register
x.
. . . 210
Boundary Scan Register [22]
TDI
TAP Controller
TDI
Figure 2. TAP Controller Block Diagram
TAP Electrical Characteristics (20°C < Tj < 110°C; VCC = 3.3V –0.2V and +0.3V unless otherwise noted)
Parameter
Description
Test Conditions
Min.
Max.
Unit
VIH
Input High (Logic 1) Voltage[23, 24]
VIl
Input Low (Logic 0) Voltage[23, 24]
2.0
–0.3
VCC + 0.3
V
0.8
V
ILI
Input Leakage Current
0V < VIN < VCC
–5.0
5.0
µA
ILI
TMS and TDI Input Leakage Current 0V < VIN < VCC
–30
30
µA
ILO
VOLC
VOHC
VOLT
VOHT
Output Leakage Current
LVCMOS Output Low Voltage[23, 25]
LVCMOS Output High Voltage[23, 25]
LVTTL Output Low Voltage[23]
LVTTL Output High Voltage[23]
Output disabled,
0V < VIN < VCCQ
IOLC = 100 µA
IOHC = 100 µA
IOLT = 8.0 mA
IOHT = 8.0 mA
–5.0
VCC – 0.2
2.4
5.0
µA
0.2
V
V
0.4
V
V
Notes:
22. X = 69 for the x36 configuration;
X = 50 for the x18 configuration.
23. All voltage referenced to VSS (GND).
24. Overshoot: VIH(AC) < VCC + 1.5V for t < tKHKH/2; undershoot: VIL(AC) <–0.5V for t < tKHKH/2; power-up: VIH < 3.6V and VCC < 3.135V and VCCQ < 1.4V for t <
200 ms. During normal operation, VCCQ must not exceed VCC. Control input signals (such as WEN and ADV/LD) may not have pulse widths less than tKHKL (min.).
25. This parameter is sampled.
Document #: 38-05161Rev. *E
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