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74LVC125 Ver la hoja de datos (PDF) - Philips Electronics

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74LVC125 Quad buffer/line driver; 3-State Philips
Philips Electronics Philips
74LVC125 Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
Philips Semiconductors
Quad buffer/line driver; 3-State
Product specification
74LVC125
FUNCTION TABLE
INPUTS
nOE
nA
L
L
L
H
H
X
NOTES:
H = HIGH voltage level
L = LOW voltage level
X = don’t care
Z = high impedance OFF-state
OUTPUT
nY
L
H
Z
LOGIC SYMBOL (IEEE/IEC)
2
1
3
1
EN1
5
6
4
9
8
10
12
11
13
SV00457
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
VCC
VCC
VI
VI/O
VO
Tamb
tr, tf
DC supply voltage (for max. speed performance)
DC supply voltage (for low-voltage applications)
DC input voltage range
DC input voltage range for I/Os
DC output voltage range
Operating free-air temperature range
Input rise and fall times
CONDITIONS
VCC = 1.2 to 2.7V
VCC = 2.7 to 3.6V
LIMITS
MIN
MAX
2.7
3.6
1.2
3.6
0
5.5
0
VCC
0
VCC
–40
+85
0
20
0
10
UNIT
V
V
V
V
V
°C
ns/V
ABSOLUTE MAXIMUM RATINGS1
In accordance with the Absolute Maximum Rating System (IEC 134).
Voltages are referenced to GND (ground = 0 V).
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
VCC
DC supply voltage
–0.5 to +6.5
V
IIK
DC input diode current
VI t 0
–50
mA
VI
DC input voltage
Note 2
–0.5 to +5.5
V
VI/O
DC input voltage range for I/Os
–0.5 to VCC +0.5
V
IOK
DC output diode current
VO uVCC or VO t 0
"50
mA
VOUT DC output voltage
Note 2
–0.5 to VCC +0.5
V
IOUT
DC output source or sink current
VO = 0 to VCC
"50
mA
IGND, ICC DC VCC or GND current
"100
mA
Tstg
Storage temperature range
–60 to +150
°C
Power dissipation per package
PTOT – plastic mini-pack (SO)
above +70°C derate linearly with 8 mW/K
500
– plastic shrink mini-pack (SSOP and TSSOP) above +60°C derate linearly with 5.5 mW/K
500
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
1997 Mar 18
3
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