APW7060
Reliability test program
Test item
SOLDERABILITY
HOLT
PCT
TST
ESD
Latch-Up
Method
MIL-STD-883D-2003
MIL-STD-883D-1005.7
JESD-22-B, A102
MIL-STD-883D-1011.9
MIL-STD-883D-3015.7
JESD 78
Description
245°C , 5 SEC
1000 Hrs Bias @ 125 °C
168 Hrs, 100 % RH , 121°C
-65°C ~ 150°C, 200 Cycles
VHBM > 2KV, VMM > 200V
10ms , Itr > 100mA
Carrier Tape & Reel Dimension
t
Po
P
D
E
P1
F
W
Ao
D1
Ko
T2
J
C
A
B
T1
Application A
SOP-14
(150mil)
330REF
F
7.5
B
C
100REF
13.0 + 0.5
- 0.2
D
D1
φ0.50 +
0.1
φ1.50
(MIN)
J
2 ± 0.5
Po
4.0
T1
T2
W
P
16.5REF 2.5 ± 025 16.0 ± 0.3
8
P1
Ao
Ko
t
2.0
6.5
2.10 0.3±0.05
E
1.75
(mm)
Copyright ANPEC Electronics Corp.
15
Rev. A.3 - Oct., 2003
www.anpec.com.tw