DatasheetQ Logo
Electronic component search and free download site.
Transistors,MosFET ,Diode,Integrated circuits

APA1000-CQ1152PP View Datasheet(PDF) - Actel Corporation

Part Name
Description
Manufacturer
APA1000-CQ1152PP
ACTEL
Actel Corporation ACTEL
APA1000-CQ1152PP Datasheet PDF : 178 Pages
First Prev 11 12 13 14 15 16 17 18 19 20 Next Last
ProASICPLUS Flash Family FPGAs
Boundary Scan (JTAG)
ProASICPLUS devices are compatible with IEEE Standard
1149.1, which defines a set of hardware architecture and
mechanisms for cost-effective, board-level testing. The
basic ProASICPLUS boundary-scan logic circuit is composed
of the TAP (test access port), TAP controller, test data
registers, and instruction register (Figure 2-9). This circuit
supports all mandatory IEEE 1149.1 instructions (EXTEST,
SAMPLE/PRELOAD and BYPASS) and the optional
IDCODE instruction (Table 2-6).
Each test section is accessed through the TAP, which has
five associated pins: TCK (test clock input), TDI and TDO
(test data input and output), TMS (test mode selector)
and TRST (test reset input). TMS, TDI and TRST are
equipped with pull-up resistors to ensure proper
operation when no input data is supplied to them. These
pins are dedicated for boundary-scan test usage. Actel
recommends that a nominal 20 kΩ pull-up resistor is
added to TDO and TCK pins.
The TAP controller is a four-bit state machine (16 states)
that operates as shown in Figure 2-10 on page 2-9. The
1s and 0s represent the values that must be present at
TMS at a rising edge of TCK for the given state transition
to occur. IR and DR indicate that the instruction register
or the data register is operating in that state.
ProASICPLUS devices have to be programmed at least
once for complete boundary-scan functionality to be
available. Prior to being programmed, EXTEST is not
available. If boundary-scan functionality is required prior
to programming, refer to online technical support on the
Actel website and search for ProASICPLUS BSDL.
I/O
I/O
I/O
I/O
I/O
Test Data
Registers
Bypass Register
TAP
Controller
Instruction
Register
Device
Logic
I/O
I/O
I/O
I/O
I/O
Figure 2-9 • ProASICPLUS JTAG Boundary Scan Test Logic Circuit
Table 2-6 • Boundary-Scan Opcodes
Table 2-6 • Boundary-Scan Opcodes
Hex Opcode
Hex Opcode
EXTEST
00
CLAMP
05
SAMPLE/PRELOAD
01
BYPASS
FF
IDCODE
0F
2-8
v5.9
 

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]