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ADR435ARZ View Datasheet(PDF) - Analog Devices

Part NameADR435ARZ ADI
Analog Devices ADI
DescriptionUltralow Noise XFET® Voltage References with Current Sink and Source Capability
ADR435ARZ Datasheet PDF : 24 Pages
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ADR430/ADR431/ADR433/ADR434/ADR435/ADR439
ADR435 ELECTRICAL CHARACTERISTICS
VIN = 7.0 V to 18 V, IL = 0 mA, TA = 25°C, unless otherwise noted.
Table 6.
Parameter
OUTPUT VOLTAGE
A Grade
B Grade
INITIAL ACCURACY1
A Grade
B Grade
TEMPERATURE COEFFICIENT
A Grade
B Grade
LINE REGULATION
LOAD REGULATION
QUIESCENT CURRENT
VOLTAGE NOISE
VOLTAGE NOISE DENSITY
TURN-ON SETTLING TIME
LONG-TERM STABILITY2
OUTPUT VOLTAGE HYSTERESIS
RIPPLE REJECTION RATIO
SHORT CIRCUIT TO GND
SUPPLY VOLTAGE OPERATING RANGE
SUPPLY VOLTAGE HEADROOM
Symbol Conditions
VO
VOERR
TCVO
∆VO/∆VIN
∆VO/∆IL
∆VO/∆IL
IIN
eN p-p
eN
tR
∆VO
VO_HYS
RRR
ISC
VIN
VIN − VO
−40°C < TA < +125°C
−40°C < TA < +125°C
VIN = 7 V to 18 V, −40°C < TA < +125°C
IL = 0 mA to 10 mA, VIN = 8 V, −40°C < TA < +125°C
IL = −10 mA to 0 mA, VIN = 8 V, −40°C < TA < +125°C
No load, −40°C < TA < +125°C
0.1 Hz to 10 Hz
1 kHz
CL = 0 μF
1000 hours
fIN = 1 kHz
Min Typ Max Unit
4.994 5.000 5.006 V
4.998 5.000 5.002 V
±6 mV
±0.12 %
±2 mV
±0.04 %
2
10 ppm/°C
1
3
ppm/°C
5
20 ppm/V
15 ppm/mA
15 ppm/mA
620 800 μA
8
μV p-p
115
nV/√Hz
10
μs
40
ppm
20
ppm
−70
dB
40
mA
7.0
18 V
2
V
1 Initial accuracy does not include shift due to solder heat effect.
2 The long-term stability specification is noncumulative. The drift in subsequent 1000 hour periods is significantly lower than in the first 1000 hour period.
Rev. J | Page 8 of 24
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