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A42MX09-3BG160I View Datasheet(PDF) - Microsemi Corporation

Part NameA42MX09-3BG160I Microsemi
Microsemi Corporation Microsemi
Description40MX and 42MX FPGA Families
A42MX09-3BG160I Datasheet PDF : 142 Pages
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40MX and 42MX FPGA Families
parallel ports are connected to the internal core logic tile and the input, output and control ports of an I/O
buffer to capture and load data into the register to control or observe the logic state of each I/O.
JTAG
TMS
TCK
JTAG
TDI
Boundary Scan Register
Control Logic
Bypass
Register
TAP Controller
Instruction
Decode
Instruction
Register
Output
MUX
TDO
Figure 1-13 • 42MX IEEE 1149.1 Boundary Scan Circuitry
Table 1-3 • Test Access Port Descriptions
Port
Description
TMS
(Test Mode Select)
Serial input for the test logic control bits. Data is captured on the rising edge of the test logic
clock (TCK).
TCK
(Test Clock Input)
Dedicated test logic clock used serially to shift test instruction, test data, and control inputs
on the rising edge of the clock, and serially to shift the output data on the falling edge of the
clock. The maximum clock frequency for TCK is 20 MHz.
TDI
(Test Data Input)
Serial input for instruction and test data. Data is captured on the rising edge of the test logic
clock.
TDO
(Test Data Output)
Serial output for test instruction and data from the test logic. TDO is set to an Inactive Drive
state (high impedance) when data scanning is not in progress.
Table 1-4 • Supported BST Public Instructions
Instruction
IR Code Instruction
(IR2.IR0) Type
Description
EXTEST
000 Mandatory Allows the external circuitry and board-level interconnections to be
tested by forcing a test pattern at the output pins and capturing test
results at the input pins.
SAMPLE/PRELOAD 001 Mandatory Allows a snapshot of the signals at the device pins to be captured
and examined during operation
HIGH Z
101
Optional Tristates all I/Os to allow external signals to drive pins. Please refer to
the IEEE Standard 1149.1 specification.
CLAMP
110
Optional Allows state of signals driven from component pins to be determined
from the Boundary-Scan Register. Please refer to the IEEE Standard
1149.1 specification for details.
BYPASS
111 Mandatory Enables the bypass register between the TDI and TDO pins. The test
data passes through the selected device to adjacent devices in the
test chain.
1-14
Revision 11
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