A10V10B-1PG68I View Datasheet(PDF) - Actel Corporation

Part Name

Description

Manufacturer

A10V10B-1PG68I

ACT™ 1 Series FPGAs

Actel Corporation 

ACT™ 1 Series FPGAs

Pin Description

CLK

Clock (Input)

TTL Clock input for global clock distribution network. The

Clock input is buffered prior to clocking the logic modules.

This pin can also be used as an I/O.

DCLK

Diagnostic Clock (Input)

TTL Clock input for diagnostic probe and device

programming. DCLK is active when the MODE pin is HIGH.

This pin functions as an I/O when the MODE pin is LOW.

GND

Ground

Input LOW supply voltage.

I/O

Input/Output (Input, Output)

I/O pin functions as an input, output, three-state, or

bidirectional buffer. Input and output levels are compatible

with standard TTL and CMOS specifications. Unused I/O pins

are automatically driven LOW by the ALS software.

MODE

Mode (Input)

The MODE pin controls the use of multifunction pins (DCLK,

PRA, PRB, SDI). When the MODE pin is HIGH, the special

functions are active. When the MODE pin is LOW, the pins

function as I/O. To provide Actionprobe capability, the MODE

pin should be terminated to GND through a 10K resistor so

that the MODE pin can be pulled high when required.

NC

No Connection

This pin is not connected to circuitry within the device.

PRA

Probe A (Output)

The Probe A pin is used to output data from any user-defined

design node within the device. This independent diagnostic

pin is used in conjunction with the Probe B pin to allow

real-time diagnostic output of any signal path within the

device. The Probe A pin can be used as a user-defined I/O

when debugging has been completed. The pin’s probe

capabilities can be permanently disabled to protect the

programmed design’s confidentiality. PRA is active when the

MODE pin is HIGH. This pin functions as an I/O when the

MODE pin is LOW.

PRB

Probe B (Output)

The Probe B pin is used to output data from any user-defined

design node within the device. This independent diagnostic

pin is used in conjunction with the Probe A pin to allow

real-time diagnostic output of any signal path within the

device. The Probe B pin can be used as a user-defined I/O

when debugging has been completed. The pin’s probe

capabilities can be permanently disabled to protect the

programmed design’s confidentiality. PRB is active when the

MODE pin is HIGH. This pin functions as an I/O when the

MODE pin is LOW.

SDI

Serial Data Input (Input)

Serial data input for diagnostic probe and device

programming. SDI is active when the MODE pin is HIGH. This

pin functions as an I/O when the MODE pin is LOW.

V CC

Supply Voltage

Input HIGH supply voltage.

Absolute Maximum Ratings1

Free air temperature range

Symbol Parameter

Limits

Units

VCC

DC Supply Voltage2

–0.5 to +7.0

Volts

VI

Input Voltage

–0.5 to VCC +0.5 Volts

VO

Output Voltage

–0.5 to VCC +0.5 Volts

IIO

I/O Sink/Source

Current3

± 20

mA

TSTG Storage Temperature –65 to +150

°C

Notes:

1. Stresses beyond those listed under “Absolute Maximum Ratings”

may cause permanent damage to the device. Exposure to

absolute maximum rated conditions for extended periods may

affect device reliability. Device should not be operated outside

the Recommended Operating Conditions.

2. VPP = VCC , except during device programming.

3. Device inputs are normally high impedance and draw

extremely low current. However, when input voltage is greater

than VCC + 0.5 V or less than GND – 0.5 V, the internal protection

diode will be forward biased and can draw excessive current.

Recommended Operating Conditions

Parameter

Commercial Industrial Military Units

Temperature

0 to

Range1

+70

–40 to

–55 to

+85

+125

°C

Power Supply

Tolerance

±5

± 10

± 10

%VCC

Note:

1. Ambient temperature (TA) used for commercial and industrial;

case temperature (TC) used for military.

1-287

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