DatasheetQ Logo
Electronic component search and free download site.
Transistors,MosFET ,Diode,Integrated circuits

74LVQ245 View Datasheet(PDF) - Fairchild Semiconductor

Part Name
Description
Manufacturer
74LVQ245 Datasheet PDF : 6 Pages
1 2 3 4 5 6
Absolute Maximum Ratings(Note 1)
Supply Voltage (VCC)
DC Input Diode Current (IIK)
VI = −0.5V
VI = VCC + 0.5V
DC Input Voltage (VI)
DC Output Diode Current (IOK)
VO = −0.5V
VO = VCC + 0.5V
DC Output Voltage (VO)
DC Output Source
or Sink Current (IO)
DC VCC or Ground Current
(ICC or IGND)
Storage Temperature (TSTG)
DC Latch-Up Source or
Sink Current
0.5V to +7.0V
20 mA
+20 mA
0.5V to VCC + 0.5V
20 mA
+20 mA
0.5V to VCC + 0.5V
±50 mA
±400 mA
65°C to +150°C
±300 mA
Recommended Operating
Conditions (Note 2)
Supply Voltage (VCC)
Input Voltage (VI)
Output Voltage (VO)
Operating Temperature (TA)
Minimum Input Edge Rate (V/t)
VIN from 0.8V to 2.0V
VCC @ 3.0V
2.0V to 3.6V
0V to VCC
0V to VCC
40°C to +85°C
125 mV/ns
Note 1: The Absolute Maximum Ratingsare those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum ratings.
The Recommended Operating Conditionstable will define the conditions
for actual device operation.
Note 2: Unused inputs must be held HIGH or LOW. They may not float.
DC Electrical Characteristics
Symbol
Parameter
VCC
(V)
VIH
Minimum High Level
3.0
Input Voltage
VIL
Maximum Low Level
3.0
Input Voltage
VOH
Minimum High Level
3.0
Output Voltage
3.0
VOL
Maximum Low Level
3.0
Output Voltage
3.0
IIN
IOLD
IOHD
ICC
Maximum Input Leakage Current 3.6
Minimum Dynamic
3.6
Output Current (Note 4)
3.6
Maximum Quiescent
3.6
Supply Current
TA = +25°C
TA = −40°C to +85°C
Typ
Guaranteed Limits
1.5
2.0
2.0
1.5
2.99
0.002
0.8
2.9
2.58
0.1
0.36
±0.1
4.0
0.8
2.9
2.48
0.1
0.44
±1.0
36
25
40.0
Units
V
V
V
V
V
V
µA
mA
mA
µA
Conditions
VOUT = 0.1V
or VCC 0.1V
VOUT = 0.1V
or VCC 0.1V
IOUT = −50 µA
VIN = VIL or VIH (Note 3)
IOH = −12 mA
IOUT = 50 µA
VIN = VIL or VIH (Note 3)
IOL = +12 mA
VI = VCC, GND
VOLD = 0.8V Max (Note 5)
VOHD = 2.0V Min (Note 5)
VIN = VCC
or GND
IOZT
VOLP
VOLV
VIHD
Maximum I/O
Leakage Current
Quiet Output
Maximum Dynamic VOL
Quiet Output
Minimum Dynamic VOL
Maximum High Level
Dynamic Input Voltage
3.6
±0.3
±3.0
3.3
0.5
0.8
3.3
0.5
0.8
3.3
1.6
2.0
VI (OE) = VIL, VIH
µA
VI = VCC, GND
VO = VCC, GND
V
(Note 6)(Note 7)
V
(Note 6)(Note 7)
V (Note 6)(Note 8)
VILD
Maximum Low Level
Dynamic Input Voltage
3.3
1.7
0.8
V (Note 6)(Note 8)
Note 3: All outputs loaded; thresholds on input associated with output under test.
Note 4: Maximum test duration 2.0 ms, one output loaded at a time.
Note 5: Incident wave switching on transmission lines with impedances as low as 75for commercial temperature range is guaranteed for 74LVQ.
Note 6: Worst case package.
Note 7: Max number of outputs defined as (n). Data inputs are driven 0V to 3.3V; one output at GND.
Note 8: Max number of Data Inputs (n) switching. (n 1) inputs switching 0V to 3.3V. Input-under-test switching: 3.3V to threshold (VILD), 0V to threshold
(VIHD), f = 1 MHz.
www.fairchildsemi.com
2
 

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]