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74LVQ245QSCX(1998) View Datasheet(PDF) - Fairchild Semiconductor

Part Name
Description
Manufacturer
74LVQ245QSCX
(Rev.:1998)
Fairchild
Fairchild Semiconductor Fairchild
74LVQ245QSCX Datasheet PDF : 6 Pages
1 2 3 4 5 6
Absolute Maximum Ratings (Note 1)
Supply Voltage (VCC)
DC Input Diode Current (IIK)
VI = −0.5V
VI = VCC + 0.5V
DC Input Voltage (VI)
DC Output Diode Current (IOK)
VO = −0.5V
VO = VCC + 0.5V
DC Output Voltage (VO)
DC Output Source
or Sink Current (IO)
DC VCC or Ground Current
(ICC or IGND)
Storage Temperature (TSTG)
DC Latch-Up Source or
Sink Current
−0.5V to +7.0V
−20 mA
+20 mA
−0.5V to VCC + 0.5V
−20 mA
+20 mA
−0.5V to VCC + 0.5V
±50 mA
±400 mA
−65˚C to +150˚C
±300 mA
DC Electrical Characteristics
Recommended Operating
Conditions (Note 2)
Supply Voltage (VCC)
Input Voltage (VI)
Output Voltage (VO)
Operating Temperature (TA)
Minimum Input Edge Rate (V/t)
2.0V to 3.6V
0V to VCC
0V to VCC
−40˚C to +85˚C
VIN from 0.8V to 2.0V
VCC @ 3.0V
125 mV/ ns
Note 1: The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be op-
erated at these limits. The parametric values defined in the Electrical Charac-
teristics tables are not guaranteed at the absolute maximum ratings. The
“Recommended Operating Conditions” table will define the conditions for ac-
tual device operation.
Note 2: Unused inputs must be held HIGH or LOW. They may not float.
Symbol
Parameter
VIH
Minimum High Level
Input Voltage
VIL
Maximum Low Level
Input Voltage
VOH
Minimum High Level
Output Voltage
VOL
Maximum Low Level
Output Voltage
IIN
IOLD
IOHD
ICC
IOZT
Maximum Input
Leakage Current
Minimum Dynamic
Output Current (Note 4)
Maximum Quiescent
Supply Current
Maximum I/O
Leakage Current
VOLP
VOLV
VIHD
VILD
Quiet Output
Maximum Dynamic VOL
Quiet Output
Minimum Dynamic VOL
Maximum High Level
Dynamic Input Voltage
Maximum Low Level
Dynamic Input Voltage
VCC
(V)
TA = +25˚C
TA = −40˚C to +85˚C Units
Conditions
Typ
Guaranteed Limits
3.0
1.5
2.0
3.0
1.5
0.8
3.0
2.99
2.9
3.0
2.58
3.0
0.002
0.1
3.0
0.36
3.6
±0.1
2.0
0.8
2.9
2.48
0.1
0.44
±1.0
V
VOUT = 0.1V
or VCC − 0.1V
V
VOUT = 0.1V
or VCC − 0.1V
V
IOUT = −50 µA
V
VIN = VIL or VIH (Note 3)
IOH = −12 mA
V
IOUT = 50 µA
V
VIN = VIL or VIH (Note 3)
IOL = +12 mA
µA
VI = VCC, GND
3.6
3.6
3.6
4.0
3.6
±0.3
3.3
0.5
0.8
36
−25
40.0
±3.0
mA
VOLD = 0.8V Max (Note 5)
mA
VOHD = 2.0V Min (Note 5)
µA
VIN = VCC
or GND
µA
VI (OE) = VIL, VIH
VI = VCC, GND
VO = VCC, GND
V
(Notes 6, 7)
3.3
−0.5
−0.8
V
(Notes 6, 7)
3.3
1.6
2.0
V
(Notes 6, 8)
3.3
1.7
0.8
V
(Notes 6, 8)
Note 3: All outputs loaded; thresholds on input associated with output under test.
Note 4: Maximum test duration 2.0 ms, one output loaded at a time.
Note 5: Incident wave switching on transmission lines with impedances as low as 75for commercial temperature range is guaranteed for 74LVQ.
Note 6: Worst case package.
Note 7: Max number of outputs defined as (n). Data inputs are driven 0V to 3.3V; one output at GND.
Note 8: Max number of Data Inputs (n) switching. (n − 1) inputs switching 0V to 3.3V. Input-under-test switching: 3.3V to threshold (VILD), 0V to threshold (VIHD),
f = 1 MHz.
3
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