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74AHC30PW View Datasheet(PDF) - NXP Semiconductors.

Part Name
Description
Manufacturer
74AHC30PW
NXP
NXP Semiconductors. NXP
74AHC30PW Datasheet PDF : 14 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
NXP Semiconductors
74AHC30; 74AHCT30
8-input NAND gate
VI 90 %
tW
negative
pulse
VM
GND
10 %
tf
tr
VI
90 %
positive
pulse
VM
10 %
GND
tW
VCC
VI
G
DUT
RT
VM
tr
tf
VM
VO
CL
001aah768
Fig 7.
Test data is given in Table 9.
Definitions for test circuit:
RT = termination resistance should be equal to the output impedance Zo of the pulse generator.
CL = load capacitance including jig and probe capacitance.
Load circuitry for measuring switching times
Table 9. Test data
Type
74AHC30
74AHCT30
Input
VI
VCC
3.0 V
tr, tf
3.0 ns
3.0 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
Test
tPLH, tPHL
tPLH, tPHL
74AHC_AHCT30_3
Product data sheet
Rev. 03 — 26 June 2009
© NXP B.V. 2009. All rights reserved.
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