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74AHC1G125GV View Datasheet(PDF) - NXP Semiconductors.

Part Name
Description
Manufacturer
74AHC1G125GV
NXP
NXP Semiconductors. NXP
74AHC1G125GV Datasheet PDF : 16 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
NXP Semiconductors
74AHC1G125; 74AHCT1G125
Bus buffer/line driver; 3-state
VI 90 %
tW
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VM
tr
tf
VM
VI
G
VCC
VO
DUT
RT
VCC
RL S1
CL
open
001aad983
Fig 9.
Test data is given in Table 10.
Definitions test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
RL = Load resistance.
S1 = Test selection switch.
Test circuit for measuring switching times
Table 10. Test data
Type
Input
VI
74AHC1G125
VCC
74AHCT1G125 3 V
tr, tf
3 ns
3 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
RL
1 k
1 k
S1 position
tPHL, tPLH
open
open
tPZH, tPHZ
GND
GND
tPZL, tPLZ
VCC
VCC
74AHC_AHCT1G125_9
Product data sheet
Rev. 09 — 22 June 2009
© NXP B.V. 2009. All rights reserved.
9 of 16
 

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