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E28F016SV-70 View Datasheet(PDF) - Intel

Part Name
Description
Manufacturer
E28F016SV-70 Datasheet PDF : 63 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
28F016SV FlashFile™ MEMORY
E
Number
-001
-002
-003
REVISION HISTORY
Description
Original Version
Added 28F016SV-065/-070 at 5V VCC and 28F016SV-075 at 3.3V VCC.
Improved burst write transfer rate to 30.8 MB/sec.
Added 56-lead SSOP Type I packaging information.
Changed VPPLK from 2V to 1.5V.
Increased ICCR at 5V VCC and 3.3V VCC:
ICCR1 from 30 mA (typ)/35 mA (max) to 40 mA (typ)/50 mA (max) @ VCC = 3.3V
ICCR2 from 15 mA (typ)/20 mA (max) to 20 mA (typ)/30 mA (max) @ VCC = 3.3V
ICCR1 from 50 mA (typ)/60 mA (max) to 75 mA (typ)/95 mA (max) @ VCC = 5V
ICCR2 from 30 mA (typ)/35 mA (max) to 45 mA (typ)/55 mA (max) @ VCC = 5V
Moved AC Characteristics for Extended Register Reads into separate table.
Increased VPP MAX from 13V to 14V.
Added Erase Suspend Command Latency times to Section 5.12
Modified Device Nomenclature Section to include SSOP package option and Ordering
Information
Changed definition of “NC.” Removed “No internal connection to die” from description.
Added “xx” to Upper Byte of Command (Data) Definition in Sections 4.3 and 4.4.
Added Note to Sleep Command (Section 4.4) denoting that the chip must be de-selected
in order for the power consumption in sleep mode to reach deep power-down
levels.
Modified parameters “V” and “I” of Section 5.1 to apply to “NC” pins.
Increased IPPR (VPP Read Current) for VPP> VCC to 200 µA at VCC = 3.3V and VCC = 5V
Changed VCC = 5V DC Characteristics (Section 5.5) marked with Note 1 to indicate
that these currents are specified for a CMOS rise/fall time (10% to 90%) of <5 ns
and a TTL rise/fall time of <10 ns.
Corrected the graphical representation of tWHGL and tEHGL in Figures 15 and 16.
Increased Typical “Page Buffer Byte/Word Program Times” from 6.0 µs to 8.0 µs (Byte)
and 12.1 µs to 16.0 µs (Word) @ VCC = 3.3V/5V and VPP = 5V:
Increased Typ. “Byte/Word Program Times” (tWHRH1A/tWHRH1B) for VPP = 5V (Section
5.12)
tWHRH1A from 16.5 µs to 29.0 µs and tWHRH1B from 24.0 µs to 35.0 µs at VCC =3.3V
tWHRH1A from 11.0 µs to 20.0 µs and tWHRH1B from 16.0 µs to 25.0 µs at VCC = 5V
Increased Typical “Block Program Times” (t WHRH2/tWHRH3)for VPP =5V (Section 5.12):
t WHRH2 from 1.1 sec to 1.9 sec and t WHRH3 from 0.8 sec to 1.2 sec at VCC = 3.3V
t WHRH2 from 0.8 sec to 1.4 sec and t WHRH3 from 0.6 sec to 0.85 sec at VCC = 5V
Changed “Time from Erase Suspend Command to WSM Ready” spec name to “Erase
Suspend Latency Time to Read;” modified typical values and added Min/Max
values at VCC =3.3/5V and VPP =5V/12V (Section 5.12)
Added “Erase Suspend Latency Time to Program” Specifications to Section 5.12
Minor cosmetic changes throughout document
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