STQ-3016Z View Datasheet(PDF) - Unspecified

Part Name

Description

Manufacturer

STQ-3016Z

Reliability Qualification Report

Unspecified 

STQ-2016Z Reliability Qualification Report

V. Qualification Methodology

The Sirenza Microdevices qualification process consists of a series of tests designed to

stress various potential failure mechanisms. This testing is performed to ensure that

Sirenza Microdevices products are robust against potential failure modes that could arise

from the various die and package failure mechanisms stressed. The qualification testing

is based on JESD test methods common to the semiconductor industry. The

manufacturing test specifications are used as the PASS/FAIL criteria for initial and final

DC/RF tests.

VI. Qualification By Similarity

A device can be qualified by similarity to previously qualified products provided that no

new potential failure modes/mechanisms are possible in the new design. The following

products have been qualified by similarity to STQ-2016Z:

STQ-1016Z STQ-3016Z SRF-1016Z SRF-2016Z SRQ-2116Z

VII. Operational Life Testing

Sirenza Microdevices defines operational life testing as a DC biased elevated

temperature test performed at the maximum operational junction temperature limit. For

the STQ-2016Z the maximum operational temperature limit is 150oC. The purpose of the

operational life test is to statistically show that the product operated at its maximum

operational ratings will be reliable by operating several hundred devices for a total time of

1000 hours. The results for this test are expressed in device hours that are calculated by

multiplying the total number of devices passing the test by the number of hours tested.

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