Electronic component search and free download site.
Transistors,MosFET ,Diode,Integrated circuits

AM29F016B-150EC View Datasheet(PDF) - Advanced Micro Devices

Part NameDescriptionManufacturer
AM29F016B-150EC 16 Megabit (2 M x 8-Bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory AMD
Advanced Micro Devices AMD
AM29F016B-150EC Datasheet PDF : 38 Pages
First Prev 31 32 33 34 35 36 37 38
PRELIMINARY
ERASE AND PROGRAMMING PERFORMANCE
Parameter
Sector Erase Time
Chip Erase Time
Byte Programming Time
Chip Programming Time (Note 3)
Typ (Note 1)
1
32
7
14.4
Max (Note 2)
8
256
300
43.2
Unit
Comments
sec Excludes 00h programming prior to
sec erasure (Note 4)
µs Excludes system-level overhead
sec (Note 5)
Notes:
1. Typical program and erase times assume the following conditions: 25°C, 5.0 V VCC, 1,000,000 cycles. Additionally,
programming typicals assume checkerboard pattern.
2. Under worst case conditions of 90°C, VCC = 4.5 V, 1,000,000 cycles.
3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes
program faster than the maximum byte program time listed. If the maximum byte program time given is exceeded, only then
does the device set DQ5 = 1. See the section on DQ5 for further information.
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.
5. System-level overhead is the time required to execute the four-bus-cycle sequence for programming. See Table 6 for further
information on command definitions.
6. The device has a guaranteed minimum erase and program cycle endurance of 1,000,000 cycles.
LATCHUP CHARACTERISTICS
Input Voltage with respect to VSS on I/O pins
VCC Current
Includes all pins except VCC. Test conditions: VCC = 5.0 Volt, one pin at a time.
Min
–1.0 V
–100 mA
Max
VCC + 1.0 V
+100 mA
TSOP AND SO PIN CAPACITANCE
Parameter
Symbol
Parameter Description
CIN
COUT
CIN2
Input Capacitance
Output Capacitance
Control Pin Capacitance
Notes:
1. Sampled, not 100% tested.
2. Test conditions TA = 25°C, f = 1.0 MHz.
DATA RETENTION
Parameter
Minimum Pattern Data Retention Time
Test Conditions
VIN = 0
VOUT = 0
VIN = 0
Test Conditions
150°C
125°C
Min Max Unit
6
7.5
pF
8.5
12
pF
7.5
9
pF
Min
Unit
10
Years
20
Years
34
Am29F016B
Direct download click here

 

Share Link : 
All Rights Reserved© datasheetq.com 2015 - 2019  ] [ Privacy Policy ] [ Request Datasheet  ] [ Contact Us ]