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AM29F016B-150EE View Datasheet(PDF) - Advanced Micro Devices

Part Name
Description
Manufacturer
AM29F016B-150EE Datasheet PDF : 38 Pages
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PRELIMINARY
TEST CONDITIONS
5.0 V
Device
Under
Test
CL
6.2 k
2.7 k
Note: Diodes are IN3064 or equivalent
Figure 8. Test Setup
21444B-15
Table 7. Test Specifications
Test Condition
All speed
options
Unit
Output Load
1 TTL gate
Output Load Capacitance, CL
(including jig capacitance)
100
pF
Input Rise and Fall Times
20
ns
Input Pulse Levels
0.45–2.4
V
Input timing measurement
reference levels
0.8
V
Output timing measurement
reference levels
2.0
V
KEY TO SWITCHING WAVEFORMS
WAVEFORM
INPUTS
Steady
OUTPUTS
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
KS000010-PAL
24
Am29F016B
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