HCF40110BC1 View Datasheet(PDF) - STMicroelectronics
Part Name
Description
Manufacturer
HCF40110BC1 Datasheet PDF : 11 Pages
| |||
HCC/HCF40110B
DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb = 25 oC, CL = 50 pF, RL = 200 KΩ,
typical temperature coefficent for all VDD values is 03 %/oC, all input rise and fall times= 20 ns)
Symbol
Parameter
CLOCK UP/CLOCK DOWN
tW Pulse Width
fCL Maximum Frequency
tWC Carry Pulse Width
tWB Borrow Pulse Width
RESET
tPLH
tPHL
Propagation Delay Time
Reset to Clock
Delay from Reset to First Allowable Clock
tW Pulse Width
Test Conditions
Value
Unit
VDD (V) Min. Typ. Max.
5
85
10
35
ns
15
15
5
2.5
10
5
MHz
15
8
5
225
10
100
15
70
ns
5
260
10
110
15
80
5
750
10
285
15
200
5
300
ns
10
125
15
75
5
150
10
60
15
40
TEST CIRCUITS
Quiescent Device Current.
Noise Immunity.
6/11
|
|
Share Link: 