MAQ3690FC View Datasheet(PDF) - Dynex Semiconductor

Part Name

Description

Manufacturer

MAQ3690FC

1553B Bus Controller/Remote Terminal

Dynex Semiconductor 

MA3690/1/3

RADIATION TOLERANCE

Total Dose Radiation Testing

For product procured to guaranteed total dose radiation

levels, each wafer lot will be approved when all sample

devices from each lot pass the total dose radiation test.

The sample devices will be subjected to the total dose

radiation level (Cobalt-60 Source), defined by the ordering

code, and must continue to meet the electrical parameters

specified in the data sheet. Electrical tests, pre and post

irradiation, will be read and recorded.

GEC Plessey Semiconductors can provide radiation

testing compliant with Mil-Std-883 test method 1019, Ionizing

Radiation (Total Dose).

Total Dose (Function to specification)*

3x105 Rad(Si)

Transient Upset (Stored data loss)

5x1010 Rad(Si)/sec

Transient Upset (Survivability)

>1x1012 Rad(Si)/sec

Neutron Hardness (Function to specification) >1x1015 n/cm2

Single Event Upset**

<1x10-10 Errors/bit day

Latch Up

Not possible

* Other total dose radiation levels available on request

** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit

Figure 44: Radiation Hardness Parameters

ORDERING INFORMATION

Unique Circuit Designator

Radiation Tolerance

S Radiation Hard Processing

R 100 kRads (Si) Guaranteed

Q 300 kRads (Si) Guaranteed

H 1000 kRads (Si) Guaranteed

MAx3690xxxxx

MAx3691xxxxx

MAx3693Cxxxx

Package Type

C Ceramic DIL (Solder Seal)

F Flatpack (Solder Seal)

N Naked Die

For details of reliability, QA/QC, test and assembly

options, see ‘Manufacturing Capability and Quality

Assurance Standards’ Section 9.

QA/QCI Process

(See Section 9 Part 4)

Test Process

(See Section 9 Part 3)

Assembly Process

(See Section 9 Part 2)

Reliability Level

L Rel 0

C Rel 1

D Rel 2

E Rel 3/4/5/STACK

B Class B

S Class S

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