74LV00PWDH View Datasheet(PDF) - Philips Electronics

Part Name

Description

Manufacturer

74LV00PWDH

Quad 2-input NAND gate

Philips Electronics 

Philips Semiconductors

Quad 2-input NAND gate

Product specification

74LV00

DC ELECTRICAL CHARACTERISTICS (Continued)

Over recommended operating conditions. Voltages are referenced to GND (ground = 0V).

LIMITS

SYMBOL PARAMETER

TEST CONDITIONS

-40°C to +85°C

MIN

TYP1 MAX

II

Input leakage

current

VCC = 5.5V; VI = VCC or GND

1.0

ICC

Quiescent supply

current; SSI

VCC = 5.5V; VI = VCC or GND; IO = 0

20.0

Additional

∆ICC quiescent supply VCC = 2.7V to 3.6V; VI = VCC –0.6V

500

current

NOTE:

1. All typical values are measured at Tamb = 25°C.

-40°C to +125°C

MIN

MAX

1.0

40

850

UNIT

µA

µA

µA

AC CHARACTERISTICS

GND = 0V; tr = tf ≤ 2.5ns; CL = 50pF; RL = 1KΩ

SYMBOL

PARAMETER

WAVEFORM

CONDITION

VCC(V)

1.2

tPHL/PLH

Propagation delay

nA, nB to nY

Figures 1, 2

2.0

2.7

3.0 to 3.6

4.5 to 5.5

NOTES:

1. Unless otherwise stated, all typical values are measured at Tamb = 25°C.

2. Typical values are measured at VCC = 3.3 V.

3. Typical values are measured at VCC = 5.0 V.

LIMITS

–40 to +85 °C

MIN TYP1 MAX

45

15

26

11

18

92

15

6.53

11

–40 to +125 °C

MIN MAX

31

23

18

14

UNIT

ns

AC WAVEFORMS

VM = 1.5 V at VCC ≥ 2.7 V and ≤ 3.6 V;

VM = 0.5 × VCC at VCC < 2.7 V and ≥ 4.5 V;

VOL and VOH are the typical output voltage drop that occur with the

output load.

VI

nA, nB INPUT

VM

GND

VOH

tPHL

tPLH

nY OUTPUT

VM

VOL

SV00377

Figure 1. Input (nA, nB) to output (nY) propagation delays.

TEST CIRCUIT

Vcc

PULSE

GENERATOR

Vl

RT

D.U.T.

VO

50pF

CL

RL= 1k

Test Circuit for Outputs

DEFINITIONS

RL = Load resistor

CL = Load capacitance includes jig and probe capacitiance

RT = Termination resistance should be equal to ZOUT of pulse generators.

TEST

tPLH/tPHL

VCC

< 2.7V

2.7–3.6V

≥ 4.5 V

VI

VCC

2.7V

VCC

SV00902

Figure 2. Load circuitry for switching times.

1998 Apr 20

5

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