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1N5228B View Datasheet(PDF) - Microsemi Corporation

Part NameDescriptionManufacturer
1N5228B 500 mW GLASS AXIAL-LEAD ZENER DIODES Microsemi
Microsemi Corporation Microsemi
1N5228B Datasheet PDF : 3 Pages
1 2 3
SCOTTSDALE DIVISION
1N5221 thru 1N5281B, e3 DO-35
500 mW GLASS AXIAL-LEAD
ZENER DIODES
Max Zener Impedance
Max Reverse Current
Max Zener
JEDEC
Type No.
Note 1
Nominal
Zener
Voltage
VZ @ IZT
Volts
Test
Current
IZT
mA
A & B Suffix Only
Note 2
ZZT @ IZK
Ohms
ZZK @ IZK = 0.25
mA
Ohms
A, B, C & D Suffix Only
IR
@
VR
μA
Volts
A
B,C & D
Non-Suffix
IR @ VR Used
For Suffix A
μA
Voltage Temp.
Coeff.
(A & B Suffix
Only)
αVZ (% / oC)
Note 3
1N5231
5.1
20
17
1600
5.0
1.9
2.0
50
+/-0.030
1N5232
5.6
20
11
1600
5.0
2.9
3.0
50
+0.038
1N5233
6.0
20
7.0
1600
5.0
3.3
3.5
50
+0.038
1N5234
6.2
20
7.0
1000
5.0
3.8
4.0
50
+0.045
1N5235
6.8
20
5.0
750
3.0
4.8
5.0
30
+0.050
1N5236
7.5
20
6.0
500
3.0
5.7
6.0
30
+0.058
1N5237
8.2
20
8.0
500
3.0
6.2
6.5
30
+0.062
1N5238
8.7
20
8.0
600
3.0
6.2
6.5
30
+0.065
1N5239
9.1
20
10
600
3.0
6.7
7.0
30
+0.068
1N5240
10
20
17
600
3.0
7.6
8.0
30
+0.075
1N5241
11
20
22
600
2.0
8.0
8.4
30
+0.076
1N5242
12
20
30
600
1.0
8.7
9.1
10
+0.077
1N5243
13
9.5
13
600
0.5
9.4
9.9
10
+0.079
1N5244
14
9.0
15
600
0.1
9.5
10
10
+0.082
1N5245
15
8.5
16
600
0.1
10.5
11
10
+0.082
1N5246
16
7.8
17
600
0.1
11.4
12
10
+0.083
1N5247
17
7.4
19
600
0.1
12.4
13
10
+0.084
1N5248
18
7.0
21
600
0.1
13.3
14
10
+0.085
1N5249
19
6.6
23
600
0.1
13.3
14
10
+0.086
1N5250
20
6.2
25
600
0.1
14.3
15
10
+0.086
1N5251
22
5.6
29
600
0.1
16.2
17
10
+0.087
1N5252
24
5.2
33
600
0.1
17.1
18
10
+0.088
1N5253
25
5.0
35
600
0.1
18.1
19
10
+0.089
1N5254
27
4.6
41
600
0.1
20
21
10
+0.090
1N5255
28
4.5
44
600
0.1
20
21
10
+0.091
1N5256
30
4.2
49
600
0.1
22
23
10
+0.091
1N5257
33
3.8
58
700
0.1
24
25
10
+0.092
1N5258
36
3.4
70
700
0.1
26
27
10
+0.093
1N5259
39
3.2
80
800
0.1
29
30
10
+0.094
1N5260
43
3.0
93
900
0.1
31
33
10
+0.095
1N5261
47
2.7
105
1000
0.1
34
36
10
+0.095
1N5262
51
2.5
125
1100
0.1
37
39
10
+0.096
1N5263
56
2.2
150
1300
0.1
41
43
10
+0.096
1N5264
60
2.1
170
1400
0.1
44
46
10
+0.097
1N5265
62
2.0
185
1400
0.1
45
47
10
+0.097
1N5266
68
1.8
230
1600
0.1
49
52
10
+0.097
1N5267
75
1.7
270
1700
0.1
53
56
10
+0.098
1N5268
82
1.5
330
2000
0.1
59
62
10
+0.098
1N5269
87
1.4
370
2200
0.1
65
68
10
+0.099
1N5270
91
1.4
400
2300
0.1
66
69
10
+0.099
1N5271
100
1.3
500
2600
0.1
72
76
10
+0.110
1N5272
110
1.1
750
3000
0.1
80
84
10
+0.110
1N5273
120
1.0
900
4000
0.1
86
91
10
+0.110
1N5274
130
0.95
1100
4500
0.1
94
99
10
+0.110
1N5275
140
0.90
1300
4500
0.1
101
106
10
+0.110
1N5276
150
0.85
1500
5000
0.1
108
114
10
+0.110
1N5277
160
0.80
1700
5500
0.1
116
122
10
+0.110
1N5278
170
0.74
1900
5500
0.1
123
129
10
+0.110
1N5279
180
0.68
2200
6000
0.1
130
137
10
+0.110
1N5280
190
0.66
2400
6500
0.1
137
144
10
+0.110
1N5281
200
0.65
2500
7000
0.1
144
152
10
+0.110
*JEDEC registered data. JEDEC type numbers listed indicate a tolerance of +/-20% with guaranteed limits on only VZ, IR, and VF. Devices with
guaranteed limits on all six parameters are indicated by suffix A for +/-10% tolerance and suffix B for +/-5% tolerance. Also available with suffix C
or D which indicates 2% and 1% tolerance respectively.
NOTES:
1. The electrical characteristics are measured after allowing the device to stabilize for 20 seconds when mounted with a 3/8” (10 mm) minimum
lead length from the case.
2. The zener impedance is derived from the 60 Hz ac voltage that results when an ac current having an rms value equal to 10% of the dc zener
current (IZT or IZK) is superimposed on IZT or IZK. Zener impedance is measured at two points to ensure a sharp knee on the breakdown curve,
thereby eliminating unstable units. Also see MicroNote 202 for variation in dynamic impedance with different operating currents.
3. Temperature coefficient (αVZ). Test conditions for temperature coefficient are as follows:
a. IZT = 7.5 mA, T1 = 25oC, T2 = 125oC (1N5221A, B thru 1N5242A, B).
b. IZT = Rated IZT, T1 = 25oC, T2 = 125oC (1N5243A, B thru 1N5281A, B).
(Device to be temperature stabilized with current applied prior to reading breakdown voltage at the specified ambient temp.)
Copyright © 2005
8-09-2005 REV D
Microsemi
Scottsdale Division
8700 E. Thomas Rd. PO Box 1390, Scottsdale, AZ 85252 USA, (480) 941-6300, Fax: (480) 947-1503
Page 2
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