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0201YD331KATUA View Datasheet(PDF) - AVX Corporation

Part NameDescriptionManufacturer
0201YD331KATUA General Purpose Dielectric for Ceramic Capacitors AVX
AVX Corporation AVX
0201YD331KATUA Datasheet PDF : 4 Pages
1 2 3 4
X5R Dielectric
Specifications and Test Methods
Parameter/Test
Operating Temperature Range
Capacitance
Dissipation Factor
Insulation Resistance
Dielectric Strength
Resistance to
Flexure
Stresses
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Solderability
Resistance to
Solder Heat
Thermal
Shock
Load Life
Load
Humidity
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
X5R Specification Limits
-55ºC to +85ºC
Within specified tolerance
≤ 2.5% for ≥ 50V DC rating
≤ 3.0% for 25V, 35V DC rating
≤ 12.5% Max. for 16V DC rating and lower
Contact Factory for DF by PN
10,000MΩ or 500MΩ - μF,
whichever is less
No breakdown or visual defects
No defects
≤ ±12%
Meets Initial Values (As Above)
Measuring Conditions
Temperature Cycle Chamber
Freq.: 1.0 kHz ± 10%
Voltage: 1.0Vrms ± .2V
For Cap > 10 μF, 0.5Vrms @ 120Hz
Charge device with rated voltage for
120 ± 5 secs @ room temp/humidity
Charge device with 300% of rated voltage for
1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Deflection: 2mm
Test Time: 30 seconds
1mm/sec
≥ Initial Value x 0.3
≥ 95% of each terminal should be covered
with fresh solder
No defects, <25% leaching of either end terminal
90 mm
Dip device in eutectic solder at 230 ± 5ºC
for 5.0 ± 0.5 seconds
≤ ±7.5%
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Dip device in eutectic solder at 260ºC for 60
seconds. Store at room temperature for 24 ± 2
hours before measuring electrical properties.
Meets Initial Values (As Above)
No visual defects
≤ ±7.5%
Step 1: -55ºC ± 2º
Step 2: Room Temp
30 ± 3 minutes
≤ 3 minutes
Meets Initial Values (As Above)
Step 3: +85ºC ± 2º 30 ± 3 minutes
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
≤ ±12.5%
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
No visual defects
≤ ±12.5%
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
Step 4: Room Temp ≤ 3 minutes
Repeat for 5 cycles and measure after
24 ± 2 hours at room temperature
Charge device with 1.5X rated voltage in
test chamber set at 85ºC ± 2ºC for 1000 hours
(+48, -0). Note: Contact factory for *optional
specification part numbers that are tested at
< 1.5X rated voltage.
Remove from test chamber and stabilize
at room temperature for 24 ± 2 hours
before measuring.
Store in a test chamber set at 85ºC ± 2ºC/
85% ± 5% relative humidity for 1000 hours
(+48, -0) with rated voltage applied.
Remove from chamber and stabilize at
room temperature and humidity for
24 ± 2 hours before measuring.
090215
27
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